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Lyle Smith
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Transparent test method and scan flip-flop
Patent number
8,122,413
Issue date
Feb 21, 2012
Otrsotech, Limited Liability Company
Pat Hom
G11 - INFORMATION STORAGE
Information
Patent Grant
Implementing programmable logic array embedded in mask-programmed ASIC
Patent number
7,043,713
Issue date
May 9, 2006
Lightspeed Semiconductor Corp.
Robert Osann, Jr.
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
ASIC routing architecture
Patent number
6,885,043
Issue date
Apr 26, 2005
Lightspeed Semiconductor Corporation
Lyle Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Programmable logic array embedded in mask-programmed ASIC
Patent number
6,769,109
Issue date
Jul 27, 2004
Lightspeed Semiconductor Corporation
Robert Osann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Function block architecture with variable drive strengths
Patent number
6,696,856
Issue date
Feb 24, 2004
Lightspeed Semiconductor Corporation
Lyle Smith
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable logic array embedded in mask-programmed ASIC
Patent number
6,694,491
Issue date
Feb 17, 2004
Lightspeed Semiconductor Corporation
Robert Osann
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
TRANSPARENT TEST METHOD AND SCAN FLIP-FLOP
Publication number
20100169856
Publication date
Jul 1, 2010
Pat Hom
G01 - MEASURING TESTING
Information
Patent Application
Programmable logic array embedded in mask-programmed ASIC
Publication number
20040049759
Publication date
Mar 11, 2004
Robert Osann
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ASIC routing architecture
Publication number
20030155587
Publication date
Aug 21, 2003
Lyle Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Programmable logic array embedded in mask-programmed ASIC
Publication number
20020010903
Publication date
Jan 24, 2002
Robert Osann
H01 - BASIC ELECTRIC ELEMENTS