Lynn Cai

Person

Union City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,835,565
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,565,001
- Issue date Jul 21, 2009
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,403,649
- Issue date Jul 22, 2008
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,254,251
- Issue date Aug 7, 2007
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask quality control
- Patent number 6,925,202
- Issue date Aug 2, 2005
- Synopsys, Inc.
- Linard Karklin
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 6,873,720
- Issue date Mar 29, 2005
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to facilitate auto-alignment of images for def...
- Patent number 6,870,951
- Issue date Mar 22, 2005
- Numerical Technologies, Inc.
- Lynn Cai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System And Method Of Providing Mask Defect Printability Analysis
- Publication number 20090245621
- Publication date Oct 1, 2009
- Synopsys, Inc,
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System And Method Of Providing Mask Defect Printability Analysis
- Publication number 20080260235
- Publication date Oct 23, 2008
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System And Method Of Providing Mask Defect Printablity Analysis
- Publication number 20070292017
- Publication date Dec 20, 2007
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System and method of providing mask defect printability analysis
- Publication number 20050190957
- Publication date Sep 1, 2005
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus to facilitate auto-alignment of images for def...
- Publication number 20030152260
- Publication date Aug 14, 2003
- Numerical Techonlogies, Inc.
- Lynn Cai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method of providing mask defect printability analysis
- Publication number 20020164065
- Publication date Nov 7, 2002
- Numerical Technologies
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System and method of providing mask quality control
- Publication number 20020164064
- Publication date Nov 7, 2002
- Numerical Technologies, Inc.
- Linard Karklin
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

System and method of providing mask defect printability analysis

System and method of providing mask defect printability analysis

System and method of providing mask defect printability analysis

System and method of providing mask defect printability analysis

System and method of providing mask quality control

System and method of providing mask defect printability analysis

Method and apparatus to facilitate auto-alignment of images for def...

Patents Applicationslast 30 patents

System And Method Of Providing Mask Defect Printability Analysis

System And Method Of Providing Mask Defect Printability Analysis

System And Method Of Providing Mask Defect Printablity Analysis

System and method of providing mask defect printability analysis

Method and apparatus to facilitate auto-alignment of images for def...

System and method of providing mask defect printability analysis

System and method of providing mask quality control