Lynn WANG

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
IC layout post-decomposition mask allocation optimization
- Patent number 10,372,871
- Issue date Aug 6, 2019
- GLOBALFOUNDRIES Inc.
- Lynn Tao-Ning Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated design layout pattern correction based on context-aware p...
- Patent number 8,924,896
- Issue date Dec 30, 2014
- GLOBALFOUNDRIES Inc.
- Lynn Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stitch insertion for reducing color density differences in double p...
- Patent number 8,918,745
- Issue date Dec 23, 2014
- GLOBALFOUNDRIES Inc.
- Lynn Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods involving pattern matching to identify and resolve potentia...
- Patent number 8,910,090
- Issue date Dec 9, 2014
- GLOBALFOUNDRIES Inc.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for decomposing circuit design layouts and for fabricating...
- Patent number 8,555,215
- Issue date Oct 8, 2013
- GLOBALFOUNDRIES, INC.
- Yi Zou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for quantitatively evaluating the quality of double pattern...
- Patent number 8,516,407
- Issue date Aug 20, 2013
- GLOBALFOUNDRIES, INC.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for pattern matching in a double patterning technology-comp...
- Patent number 8,418,105
- Issue date Apr 9, 2013
- GLOBALFOUNDRIES, INC.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IC LAYOUT POST-DECOMPOSITION MASK ALLOCATION OPTIMIZATION
- Publication number 20190034577
- Publication date Jan 31, 2019
- GLOBALFOUNDRIES INC.
- Lynn Tao-Ning Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING FOR PREDICTING DEFECT LIMITED YIELD
- Publication number 20150286763
- Publication date Oct 8, 2015
- GLOBALFOUNDRIES INC.
- Lynn WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STITCH INSERTION FOR REDUCING COLOR DENSITY DIFFERENCES IN DOUBLE P...
- Publication number 20140282301
- Publication date Sep 18, 2014
- GLOBALFOUNDRIES INC.
- Lynn WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS INVOLVING PATTERN MATCHING TO IDENTIFY AND RESOLVE POTENTIA...
- Publication number 20140245238
- Publication date Aug 28, 2014
- GLOBALFOUNDRIES INC.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED DESIGN LAYOUT PATTERN CORRECTION BASED ON CONTEXT-AWARE P...
- Publication number 20140215415
- Publication date Jul 31, 2014
- GLOBALFOUNDRIES INC.
- Lynn WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR DECOMPOSING CIRCUIT DESIGN LAYOUTS AND FOR FABRICATING...
- Publication number 20130219347
- Publication date Aug 22, 2013
- GLOBALFOUNDRIES INC.
- Yi Zou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR QUANTITATIVELY EVALUATING THE QUALITY OF DOUBLE PATTERN...
- Publication number 20130198696
- Publication date Aug 1, 2013
- GLOBALFOUNDRIES INC.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

IC layout post-decomposition mask allocation optimization

Automated design layout pattern correction based on context-aware p...

Stitch insertion for reducing color density differences in double p...

Methods involving pattern matching to identify and resolve potentia...

Methods for decomposing circuit design layouts and for fabricating...

Methods for quantitatively evaluating the quality of double pattern...

Methods for pattern matching in a double patterning technology-comp...

Patents Applicationslast 30 patents

IC LAYOUT POST-DECOMPOSITION MASK ALLOCATION OPTIMIZATION

PATTERN MATCHING FOR PREDICTING DEFECT LIMITED YIELD

STITCH INSERTION FOR REDUCING COLOR DENSITY DIFFERENCES IN DOUBLE P...

METHODS INVOLVING PATTERN MATCHING TO IDENTIFY AND RESOLVE POTENTIA...

AUTOMATED DESIGN LAYOUT PATTERN CORRECTION BASED ON CONTEXT-AWARE P...

METHODS FOR DECOMPOSING CIRCUIT DESIGN LAYOUTS AND FOR FABRICATING...

METHODS FOR QUANTITATIVELY EVALUATING THE QUALITY OF DOUBLE PATTERN...