Lynwood W. Swanson

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Determination of emission parameters from field emission sources
- Patent number 8,779,376
- Issue date Jul 15, 2014
- FEI Company
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold field emitter
- Patent number 8,217,565
- Issue date Jul 10, 2012
- FEI Company
- Theodore Carl Tessner, II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold field emitter
- Patent number 7,888,654
- Issue date Feb 15, 2011
- FEI Company
- Theodore Carl Tessner, II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-column FIB for nanofabrication applications
- Patent number 6,797,969
- Issue date Sep 28, 2004
- FEI Company
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced-wetting, boron-based liquid-metal ion source and method
- Patent number 5,871,848
- Issue date Feb 16, 1999
- Oregon Graduate Institute of Science and Technology
- Michael J. Bozack
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass spectometry system
- Patent number 5,376,791
- Issue date Dec 27, 1994
- FEI Company
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of semiconductor device manufacture
- Patent number 5,188,705
- Issue date Feb 23, 1993
- FEI Company
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion source and alloy
- Patent number 4,775,818
- Issue date Oct 4, 1988
- Hughes Aircraft Company
- William M. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid-metal ion beam source substructure
- Patent number 4,755,683
- Issue date Jul 5, 1988
- Oregon Graduate Center
- Anthony E. Bell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion source and alloy for ion emission of multiple ioni...
- Patent number 4,670,685
- Issue date Jun 2, 1987
- Hughes Aircraft Company
- William M. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron and ion beam apparatus and passivation milling
- Patent number 4,629,898
- Issue date Dec 16, 1986
- Oregon Graduate Center
- Jonathan H. Orloff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method utilizing liquid metal f...
- Patent number 4,426,582
- Issue date Jan 17, 1984
- Oregon Graduate Center
- Jonathan H. Orloff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low work function cathode
- Patent number 4,325,000
- Issue date Apr 13, 1982
- Burroughs Corporation
- John E. Wolfe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for producing bright high resolution ion beams
- Patent number 4,139,773
- Issue date Feb 13, 1979
- Oregon Graduate Center
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Determination of Emission Parameters from Field Emission Sources
- Publication number 20130187058
- Publication date Jul 25, 2013
- FEI Company
- Lynwood W. Swanson
- G01 - MEASURING TESTING
Information Patent Application
Cold Field Emitter
- Publication number 20110101238
- Publication date May 5, 2011
- FEI Company
- Theodore Carl Tessner, II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cold field emitter
- Publication number 20080174225
- Publication date Jul 24, 2008
- FEI Company
- Theodore Carl Tessner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-column FIB for nanofabrication applications
- Publication number 20010032939
- Publication date Oct 25, 2001
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Lynwood W. Swanson

Person

Patents Grantslast 30 patents

Determination of emission parameters from field emission sources

Cold field emitter

Cold field emitter

Multi-column FIB for nanofabrication applications

Enhanced-wetting, boron-based liquid-metal ion source and method

Secondary ion mass spectometry system

Method of semiconductor device manufacture

Liquid metal ion source and alloy

Liquid-metal ion beam source substructure

Liquid metal ion source and alloy for ion emission of multiple ioni...

Electron and ion beam apparatus and passivation milling

Charged particle beam apparatus and method utilizing liquid metal f...

Low work function cathode

Method and apparatus for producing bright high resolution ion beams

Patents Applicationslast 30 patents

Determination of Emission Parameters from Field Emission Sources

Cold Field Emitter

Cold field emitter

Multi-column FIB for nanofabrication applications