M. Kent Norton

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Los Gatos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for inspecting the surface of a wafer
- Patent number 6,167,148
- Issue date Dec 26, 2000
- Ultrapointe Corporation
- Louis D. Calitz
- G01 - MEASURING TESTING
Information Patent Grant
Viewing and display apparatus
- Patent number 5,311,203
- Issue date May 10, 1994
- M. Kent Norton
- G02 - OPTICS