Maarten Bischoff

Person

Uden, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,817,290
- Issue date Nov 14, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,587,759
- Issue date Feb 21, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with imaging beam rotation
- Patent number 10,224,174
- Issue date Mar 5, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting a stem equipped with an aberration corrector
- Patent number 9,029,767
- Issue date May 12, 2015
- FEI Company
- Maarten Bischoff
- G01 - MEASURING TESTING
Information Patent Grant
Distortion free stigmation of a TEM
- Patent number 8,569,693
- Issue date Oct 29, 2013
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Laser Thermal Epitaxy in a Charged Particle Microscope
- Publication number 20240161999
- Publication date May 16, 2024
- FEI Company
- Rudolf Geurink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF POWER CONSUMPTION FOR A CHARGED PARTICLE SYSTEM
- Publication number 20240120171
- Publication date Apr 11, 2024
- FEI Company
- Casper Smit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Transferring A Sample
- Publication number 20240112879
- Publication date Apr 4, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20240029993
- Publication date Jan 25, 2024
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20230223231
- Publication date Jul 13, 2023
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR STUDYING SAMPLES USING A SCANNING TRANSMISSIO...
- Publication number 20230005710
- Publication date Jan 5, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20210272767
- Publication date Sep 2, 2021
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180323036
- Publication date Nov 8, 2018
- FEI Company
- Ali Mohammadi-Gheidari
- G02 - OPTICS
Information Patent Application
METHOD FOR ADJUSTING A STEM EQUIPPED WITH AN ABERRATION CORRECTOR
- Publication number 20130105689
- Publication date May 2, 2013
- FEI Company
- Maarten Bischoff
- G01 - MEASURING TESTING
Information Patent Application
Distortion Free Stigmation of a TEM
- Publication number 20130062520
- Publication date Mar 14, 2013
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS

Maarten Bischoff

Person

Patents Grantslast 30 patents

Method, device and system for reducing off-axial aberration in elec...

Method, device and system for reducing off-axial aberration in elec...

Transmission charged particle microscope with imaging beam rotation

Method for adjusting a stem equipped with an aberration corrector

Distortion free stigmation of a TEM

Patents Applicationslast 30 patents

Laser Thermal Epitaxy in a Charged Particle Microscope

REDUCTION OF POWER CONSUMPTION FOR A CHARGED PARTICLE SYSTEM

Systems And Methods For Transferring A Sample

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

METHOD AND SYSTEM FOR STUDYING SAMPLES USING A SCANNING TRANSMISSIO...

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

METHOD FOR ADJUSTING A STEM EQUIPPED WITH AN ABERRATION CORRECTOR

Distortion Free Stigmation of a TEM