Maarten Jansen

Person

De Rijn, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometer system, method of determining a mode hop of a laser...
- Patent number 11,719,529
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Stage system and lithographic apparatus
- Patent number 11,556,066
- Issue date Jan 17, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 11,525,737
- Issue date Dec 13, 2022
- ASML Netherland B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cyclic error measurements and calibration procedures in interferome...
- Patent number 11,287,242
- Issue date Mar 29, 2022
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system, zeroing method, lithographic apparatus...
- Patent number 10,883,816
- Issue date Jan 5, 2021
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic apparatus, device manufacturing method, and method of...
- Patent number 8,937,707
- Issue date Jan 20, 2015
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining a height of a number of spatia...
- Patent number 8,576,410
- Issue date Nov 5, 2013
- Mitutoyo Corporation
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the height of a number of spat...
- Patent number 8,553,231
- Issue date Oct 8, 2013
- Mitutoyo Corporation
- Katherine Mary Medicus
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining a height map of a surface through both in...
- Patent number 8,547,557
- Issue date Oct 1, 2013
- Mitutoyo Corporation
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer using polarization modulation
- Patent number 8,289,524
- Issue date Oct 16, 2012
- Mitutoyo Corporation
- Maarten J. Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Microscope having an inclined optical axis and three-dimensional in...
- Patent number 8,179,599
- Issue date May 15, 2012
- Mitutoyo Corporation
- Maarten J. Jansen
- G02 - OPTICS
Information Patent Grant
Dual polarization interferometers for measuring opposite sides of a...
- Patent number 7,471,396
- Issue date Dec 30, 2008
- Mitutoyo Corporation
- Maarten Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Phase shift interferometer
- Patent number 7,379,188
- Issue date May 27, 2008
- Mitutoyo Corporation
- Maarten Jansen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...
- Publication number 20240061351
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER
- Publication number 20240011762
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
A POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, AN ABSOLUTE POSITIO...
- Publication number 20230408933
- Publication date Dec 21, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS
- Publication number 20230332880
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20230324164
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
- Publication number 20230168077
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20220205775
- Publication date Jun 30, 2022
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
STAGE SYSTEM AND LITHOGRAPHIC APPARATUS
- Publication number 20220137517
- Publication date May 5, 2022
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20210072088
- Publication date Mar 11, 2021
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASUREMENT SYSTEM, ZEROING METHOD, LITHOGRAPHIC APPARATUS...
- Publication number 20200191552
- Publication date Jun 18, 2020
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
CYCLIC ERROR MEASUREMENTS AND CALIBRATION PROCEDURES IN INTERFEROME...
- Publication number 20190265019
- Publication date Aug 29, 2019
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus, Device Manufacturing Method, and Method of...
- Publication number 20130050675
- Publication date Feb 28, 2013
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS FOR DETERMINING A HEIGHT MAP OF A SURFACE THROUGH BOTH IN...
- Publication number 20110122418
- Publication date May 26, 2011
- Mitutoyo Corporation
- Maarten Jozef Jansen
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A HEIGHT OF A NUMBER OF SPATIA...
- Publication number 20110122420
- Publication date May 26, 2011
- Mitutoyo Corporation
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE HEIGHT OF A NUMBER OF SPAT...
- Publication number 20110090511
- Publication date Apr 21, 2011
- Mitutoyo Corporation
- Katherine Mary Medicus
- G01 - MEASURING TESTING
Information Patent Application
Interferometer using polarization modulation
- Publication number 20100053633
- Publication date Mar 4, 2010
- Mitutoyo Corporation
- Maarten J. Jansen
- G01 - MEASURING TESTING
Information Patent Application
Microscope and three-dimensional information acquisition method
- Publication number 20090059362
- Publication date Mar 5, 2009
- Mitutoyo Corporation
- Maarten J. Jansen
- G02 - OPTICS
Information Patent Application
Optical Interferometer
- Publication number 20070229842
- Publication date Oct 4, 2007
- Mitutoyo Corporation
- Maarten Jansen
- G01 - MEASURING TESTING
Information Patent Application
Phase shift interferometer
- Publication number 20070019203
- Publication date Jan 25, 2007
- MITUTOYO CORPORATION
- Maarten Jansen
- G01 - MEASURING TESTING

Maarten Jansen

Person

Patents Grantslast 30 patents

Interferometer system, method of determining a mode hop of a laser...

Stage system and lithographic apparatus

Wavelength tracking system, method to calibrate a wavelength tracki...

Cyclic error measurements and calibration procedures in interferome...

Position measurement system, zeroing method, lithographic apparatus...

Lithographic apparatus, device manufacturing method, and method of...

Method and apparatus for determining a height of a number of spatia...

Method and apparatus for determining the height of a number of spat...

Apparatus for determining a height map of a surface through both in...

Interferometer using polarization modulation

Microscope having an inclined optical axis and three-dimensional in...

Dual polarization interferometers for measuring opposite sides of a...

Phase shift interferometer

Patents Applicationslast 30 patents

AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...

COMPACT DUAL PASS INTERFEROMETER FOR A PLANE MIRROR INTERFEROMETER

A POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, AN ABSOLUTE POSITIO...

INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

STAGE SYSTEM AND LITHOGRAPHIC APPARATUS

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...

POSITION MEASUREMENT SYSTEM, ZEROING METHOD, LITHOGRAPHIC APPARATUS...

CYCLIC ERROR MEASUREMENTS AND CALIBRATION PROCEDURES IN INTERFEROME...

Lithographic Apparatus, Device Manufacturing Method, and Method of...

APPARATUS FOR DETERMINING A HEIGHT MAP OF A SURFACE THROUGH BOTH IN...

METHOD AND APPARATUS FOR DETERMINING A HEIGHT OF A NUMBER OF SPATIA...

METHOD AND APPARATUS FOR DETERMINING THE HEIGHT OF A NUMBER OF SPAT...

Interferometer using polarization modulation

Microscope and three-dimensional information acquisition method

Optical Interferometer

Phase shift interferometer