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Maarten Rutgers
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Los Angeles, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Assay array plate
Patent number
12,145,154
Issue date
Nov 19, 2024
Somalogic Operating Co., Inc.
Rachel Woolaver Trahan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Methods of detecting a leak from a subarray of a microarray chip, k...
Patent number
12,134,798
Issue date
Nov 5, 2024
Somalogic Operating Co., Inc.
Rachel Woolaver Trahan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Modular atomic force microscope with environmental controls
Patent number
10,416,190
Issue date
Sep 17, 2019
Oxford Instruments Asylum Research Inc
Mario Viani
G01 - MEASURING TESTING
Information
Patent Grant
Modular atomic force microscope with environmental controls
Patent number
9,581,616
Issue date
Feb 28, 2017
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Grant
Modular atomic force microscope with environmental controls
Patent number
9,097,737
Issue date
Aug 4, 2015
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Grant
Modular atomic force microscope
Patent number
8,370,960
Issue date
Feb 5, 2013
Asylum Research Corporation
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus and method for scanning capacitance microscopy and spectr...
Patent number
7,856,665
Issue date
Dec 21, 2010
Asylum Research Corporation
Maarten Rutgers
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Automotive performance meter
Patent number
7,013,207
Issue date
Mar 14, 2006
Tesla Electronics, Inc.
Jovo Majstorovic
G01 - MEASURING TESTING
Information
Patent Grant
Automotive performance meter
Patent number
6,973,377
Issue date
Dec 6, 2005
Telsa Electronics, Inc.
Jovo Majstorovic
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Modular Atomic Force Microscope
Publication number
20170254834
Publication date
Sep 7, 2017
OXFORD INSTRUMENTS PLC
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Modular Atomic Force Microscope with Environmental Controls
Publication number
20170168089
Publication date
Jun 15, 2017
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope with Environmental Controls
Publication number
20150338438
Publication date
Nov 26, 2015
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Application
Modular atomic force microscope with environmental controls
Publication number
20150150163
Publication date
May 28, 2015
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope
Publication number
20140223612
Publication date
Aug 7, 2014
ASYLUM CORPORATION
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Modular atomic force microscope
Publication number
20100275334
Publication date
Oct 28, 2010
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for scanning capacitance microscopy and spectr...
Publication number
20090084952
Publication date
Apr 2, 2009
Maarten Rutgers
G01 - MEASURING TESTING
Information
Patent Application
AUTOMOTIVE PERFORMANCE METER
Publication number
20050273238
Publication date
Dec 8, 2005
Tesla Electronics, Inc.
Jovo Majstorovic
G01 - MEASURING TESTING
Information
Patent Application
Automotive performance meter
Publication number
20040093129
Publication date
May 13, 2004
Tesla Electronics, Inc.
Jovo Majstorovic
G01 - MEASURING TESTING