Machi Moriya

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Nirasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing semiconductor device and system for manufac...
- Patent number 8,853,087
- Issue date Oct 7, 2014
- Tokyo Electron Limited
- Keisuke Tanaka
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Processing method and processing system
- Patent number 8,778,205
- Issue date Jul 15, 2014
- Tokyo Electron Limited
- Tsuyoshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Roughness evaluation method and system
- Patent number 7,733,502
- Issue date Jun 8, 2010
- Tokyo Electron Limited
- Tsuyoshi Moriya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SYSTEM FOR MANUFAC...
- Publication number 20120282713
- Publication date Nov 8, 2012
- TOKYO ELECTRON LIMITED
- Keisuke Tanaka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Processing method and processing system
- Publication number 20100133231
- Publication date Jun 3, 2010
- TOKYO ELECTRON LIMITED
- Tsuyoshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
ROUGHNESS EVALUATION METHOD AND SYSTEM
- Publication number 20080165367
- Publication date Jul 10, 2008
- TOKYO ELECTRON LIMITED
- Tsuyoshi MORIYA
- G01 - MEASURING TESTING
Information Patent Application
Processing method and processing system
- Publication number 20040260420
- Publication date Dec 23, 2004
- TOKYO ELECTRON LIMITED
- Tsuyoshi Ohno
- G01 - MEASURING TESTING