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Madan M. Patra
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testing an integrated circuit having configurable input/output term...
Patent number
8,065,570
Issue date
Nov 22, 2011
Xilinx, Inc.
Tuyet Ngoc Simmons
G01 - MEASURING TESTING
Information
Patent Grant
Input/output block and operation thereof
Patent number
8,018,250
Issue date
Sep 13, 2011
Xilinx, Inc.
Matthew H. Klein
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for detecting and correcting errors in a paral...
Patent number
7,971,115
Issue date
Jun 28, 2011
Xilinx, Inc.
Madan M. Patra
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing a controlled impedance buffer
Patent number
7,653,505
Issue date
Jan 26, 2010
Xilinx, Inc.
Tuyet Ngoc Simmons
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING AND CORRECTING ERRORS IN A PARAL...
Publication number
20100199136
Publication date
Aug 5, 2010
Xilinx, Inc.
Madan M. Patra
H03 - BASIC ELECTRONIC CIRCUITRY