Madhav Vyas

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Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for performing de-aliasing using deep learning
- Patent number 12,196,901
- Issue date Jan 14, 2025
- BP Corporation North America Inc.
- Madhav Vyas
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optimal stacking of seismic data
- Patent number 9,429,667
- Issue date Aug 30, 2016
- BP Corporation North America Inc.
- Madhav Vyas
- G01 - MEASURING TESTING
Information Patent Grant
Generating an angle domain common image gather
- Patent number 8,760,967
- Issue date Jun 24, 2014
- WesternGeco L. L. C.
- David E. Nichols
- G01 - MEASURING TESTING
Information Patent Grant
Slant-stack for time gather to angle gather conversion
- Patent number 8,588,028
- Issue date Nov 19, 2013
- WesternGeco L. L. C.
- David Nichols
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Cycle Skip Avoidance
- Publication number 20230288595
- Publication date Sep 14, 2023
- BP CORPORATION NORTH AMERICA INC.
- Madhav VYAS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING DE-ALIASING USING DEEP LEARNING
- Publication number 20220317322
- Publication date Oct 6, 2022
- BP CORPORATION NORTH AMERICA INC.
- Madhav VYAS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTIMAL STACKING OF SEISMIC DATA
- Publication number 20130286782
- Publication date Oct 31, 2013
- BP CORPORATION NORTH AMERICA INC.
- Madhav Vyas
- G01 - MEASURING TESTING
Information Patent Application
Generating an Angle Domain Common Image Gather
- Publication number 20120092962
- Publication date Apr 19, 2012
- David E. Nichols
- G01 - MEASURING TESTING
Information Patent Application
SLANT-STACK FOR TIME GATHER TO ANGLE GATHER CONVERSION
- Publication number 20110069582
- Publication date Mar 24, 2011
- David Nichols
- G01 - MEASURING TESTING