MADHUSUDAN SAMPATH

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BANGALORE, IN

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check test point identification apparatus...
- Patent number 11,454,665
- Issue date Sep 27, 2022
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Scalable and area optimized method to implement command queues in S...
- Patent number 9,990,139
- Issue date Jun 5, 2018
- Samsung Electronics Co., Ltd.
- Srinivasa Raju Nadakuditi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT SPIKE CHECK PROBING APPARATUS AND METHOD
- Publication number 20200033403
- Publication date Jan 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Application
SCALABLE AND AREA OPTIMIZED METHOD TO IMPLEMENT COMMAND QUEUES IN S...
- Publication number 20160306549
- Publication date Oct 20, 2016
- Samsung Electronics Co., Ltd.
- SRINIVASA RAJU NADAKUDITI
- G06 - COMPUTING CALCULATING COUNTING