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Magali Lambert
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Orsay, FR
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Patents Grants
last 30 patents
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Patent Grant
Sensor chip and method of manufacturing the same
Patent number
8,821,794
Issue date
Sep 2, 2014
NXP, B.V.
Evelyne Gridelet
G01 - MEASURING TESTING
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Patent Grant
Integrated circuit with grating and manufacturing method therefor
Patent number
8,450,823
Issue date
May 28, 2013
NXP B.V.
Erwin Hijzen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
INTEGRATED CIRCUIT WITH GRATING AND MANUFACTURING METHOD THEREFOR
Publication number
20110169120
Publication date
Jul 14, 2011
NXP B.V.
Erwin Hijzen
G01 - MEASURING TESTING
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Patent Application
SENSOR CHIP AND METHOD OF MANUFACTURING THE SAME
Publication number
20110027128
Publication date
Feb 3, 2011
NXP B.V.
Evelyne Gridelet
G01 - MEASURING TESTING