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Maganlal S. Patel
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Endicott, NY, US
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last 30 patents
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Patent Grant
Apparatus, and corresponding method, for stress testing semiconduct...
Patent number
5,604,445
Issue date
Feb 18, 1997
International Business Machines Corporation
Kishor V. Desai
G01 - MEASURING TESTING
Information
Patent Grant
Method of making an electronic package with enhanced heat sinking
Patent number
5,263,245
Issue date
Nov 23, 1993
International Business Machines Corporation
Maganlal S. Patel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic package with enhanced heat sinking
Patent number
5,220,487
Issue date
Jun 15, 1993
International Business Machines Corporation
Maganlal S. Patel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High density, separable connector and contact for use therein
Patent number
5,137,456
Issue date
Aug 11, 1992
International Business Machines Corporation
Kishor V. Desai
H01 - BASIC ELECTRIC ELEMENTS