Mahendra P. Ramachandran

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detecting and classifying surface defects with multiple radiation c...
- Patent number 8,823,935
- Issue date Sep 2, 2014
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection
- Patent number 8,736,831
- Issue date May 27, 2014
- KLA-Tencor Corp.
- Mahendra Prabhu Ramachandran
- G01 - MEASURING TESTING
Information Patent Grant
Substrate edge inspection
- Patent number 8,325,334
- Issue date Dec 4, 2012
- KLA-Tencor Corporation
- Mahendra P. Ramachandran
- G01 - MEASURING TESTING
Information Patent Grant
Wide spatial frequency topography and roughness measurement
- Patent number 7,362,425
- Issue date Apr 22, 2008
- Steven W. Meeks
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Substrate Inspection
- Publication number 20130308124
- Publication date Nov 21, 2013
- KLA-Tencor Corporation
- Mahendra Prabhu Ramachandran
- G01 - MEASURING TESTING
Information Patent Application
Substrate Edge Inspection
- Publication number 20110058174
- Publication date Mar 10, 2011
- KLA-Tencor Corporation
- Mahendra P. Ramachandran
- G01 - MEASURING TESTING
Information Patent Application
Wide spatial frequency topography and roughness measurement
- Publication number 20060164626
- Publication date Jul 27, 2006
- Steven W. Meeks
- G01 - MEASURING TESTING