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Mahesh Parshotam
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Edmonds, WA, US
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last 30 patents
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Patent Grant
Dual probe assembly for a printed circuit board test apparatus
Patent number
7,091,730
Issue date
Aug 15, 2006
Huntron, Inc.
Mahesh P. Parshotam
G01 - MEASURING TESTING
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Patent Grant
Multi-axis universal circuit board test fixture
Patent number
5,003,254
Issue date
Mar 26, 1991
Huntron, Inc.
Bill Hunt
G01 - MEASURING TESTING
Information
Patent Grant
System for digitizing and displaying analog signatures of integrate...
Patent number
4,965,516
Issue date
Oct 23, 1990
Huntron Instruments, Inc.
Mahesh Parshotam
G06 - COMPUTING CALCULATING COUNTING