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Mahito Shidou
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Tokyo, JP
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last 30 patents
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Patent Grant
Test system, test method and test program for an integrated circuit...
Patent number
7,096,140
Issue date
Aug 22, 2006
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Test system, test method and test program for an integrated circuit...
Publication number
20050114065
Publication date
May 26, 2005
Yasuyuki Nozuyama
G01 - MEASURING TESTING