Mahmoud BEHZADIRAD

Person

Albuquerque, NM, US

People

Patents Grantslast 30 patents

Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy based on nanowire tips for high aspect rati...
- Patent number 10,840,092
- Issue date Nov 17, 2020
- Tito Busani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEEP SMOOTH ETCHING TO REALIZE SCALABLE DEVICES HAVING PIEZOELECTRI...
- Publication number 20230329117
- Publication date Oct 12, 2023
- Tito Busani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES COMPRISING DISTRIBUTED BRAGG REFLECTORS AND METHODS OF MAKI...
- Publication number 20230011230
- Publication date Jan 12, 2023
- UNM Rainforest Innovations
- Tito BUSANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL IMPEDANCE SPECTROSCOPY FOR NON-DESTRUCTIVE, REAL-TIME, T...
- Publication number 20220163499
- Publication date May 26, 2022
- UNM Rainforest Innovations
- David Hanson
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPY BASED ON NANOWIRE TIPS FOR HIGH ASPECT RATI...
- Publication number 20200185219
- Publication date Jun 11, 2020
- STC.UNM
- Tito Busani
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20190120873
- Publication date Apr 25, 2019
- STC.UNM
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY

Mahmoud BEHZADIRAD

Person

Patents Grantslast 30 patents

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Atomic force microscopy based on nanowire tips for high aspect rati...

Patents Applicationslast 30 patents

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

DEEP SMOOTH ETCHING TO REALIZE SCALABLE DEVICES HAVING PIEZOELECTRI...

DEVICES COMPRISING DISTRIBUTED BRAGG REFLECTORS AND METHODS OF MAKI...

ELECTRICAL IMPEDANCE SPECTROSCOPY FOR NON-DESTRUCTIVE, REAL-TIME, T...

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

ATOMIC FORCE MICROSCOPY BASED ON NANOWIRE TIPS FOR HIGH ASPECT RATI...

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...