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Majeed M. Hayat
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Albuquerque, NM, US
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Patents Grants
last 30 patents
Information
Patent Grant
Resonance avalanche photodiodes for dynamic biasing
Patent number
10,777,698
Issue date
Sep 15, 2020
STC.UNM
Majeed M. Hayat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for detecting cancer
Patent number
10,278,649
Issue date
May 7, 2019
STC.UNM
Majeed M. Hayat
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Resonance avalanche photodiodes for dynamic biasing
Patent number
10,128,398
Issue date
Nov 13, 2018
STC.UNM
Majeed M. Hayat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control circuits for dynamically biased avalanche photodiodes
Patent number
9,997,644
Issue date
Jun 12, 2018
DYNAMIC PHOTONICS, INC.
Payman Zarkesh-Ha
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for feature extraction and decision making from s...
Patent number
9,691,147
Issue date
Jun 27, 2017
STC.UNM
Sanjay Krishna
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for feature extraction and decision making from s...
Patent number
9,471,974
Issue date
Oct 18, 2016
STC.UNM
Sanjay Krishna
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Material classification fused with spatio-spectral edge detection i...
Patent number
9,430,842
Issue date
Aug 30, 2016
STC.UNM
Majeed M. Hayat
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Impact ionization devices under dynamic electric fields
Patent number
9,354,113
Issue date
May 31, 2016
STC.UNM
Majeed M. Hayat
G01 - MEASURING TESTING
Information
Patent Grant
Spectral ratio contrast for edge detection in spectral images
Patent number
8,649,607
Issue date
Feb 11, 2014
STC.UNM
Majeed M. Hayat
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lens-less digital microscope
Patent number
8,624,968
Issue date
Jan 7, 2014
STC.UNM
Stephen D. Hersee
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System and method for reduction of speckle noise in an image
Patent number
8,208,724
Issue date
Jun 26, 2012
STC.UNM
Ousseini Lankoande
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for reduction of speckle noise in an image
Patent number
8,184,927
Issue date
May 22, 2012
STC.UNM
Ousseini Lankoande
G01 - MEASURING TESTING
Information
Patent Grant
Detector with tunable spectral response
Patent number
8,134,141
Issue date
Mar 13, 2012
STC.UNM
Sanjay Krishna
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Infrared retina
Patent number
8,071,945
Issue date
Dec 6, 2011
STC.UNM
Sanjay Krishna
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for reduction of speckle noise in an image
Patent number
7,961,975
Issue date
Jun 14, 2011
STC.UNM
Ousseini Lankoande
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Intersubband detector with avalanche multiplier region
Patent number
7,271,405
Issue date
Sep 18, 2007
STC.UNM
Sanjay Krishna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector with tunable spectral response
Patent number
7,217,951
Issue date
May 15, 2007
Stc@unm
Sanjay Krishna
G01 - MEASURING TESTING
Information
Patent Grant
Uniform, non-disruptive, and radiometrically accurate calibration o...
Patent number
7,132,648
Issue date
Nov 7, 2006
Science & Technology Corporation@UNM
Bradley M. Ratiff
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RESONANCE AVALANCHE PHOTODIODES FOR DYNAMIC BIASING
Publication number
20190051783
Publication date
Feb 14, 2019
STC.UNM
Majeed M. Hayat
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHODS AND SYSTEMS FOR DETECTING CANCER
Publication number
20180333105
Publication date
Nov 22, 2018
STC.UNM
Majeed M. Hayat
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHOD AND SYSTEM FOR FEATURE EXTRACTION AND DECISION MAKING FROM S...
Publication number
20170011513
Publication date
Jan 12, 2017
STC.UNM
Sanjay Krishna
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTROL CIRCUITS FOR DYNAMICALLY BIASED AVALANCHE PHOTODIODES
Publication number
20160284878
Publication date
Sep 29, 2016
Dynamic Photonics, Inc.
Payman Zarkesh-Ha
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMPACT IONIZATION DEVICES UNDER DYNAMIC ELECTRIC FIELDS
Publication number
20160254867
Publication date
Sep 1, 2016
STC.UNM
Majeed M. Hayat
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR FEATURE EXTRACTION AND DECISION MAKING FROM S...
Publication number
20150187068
Publication date
Jul 2, 2015
STC.UNM
Sanjay Krishna
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR REDUCTION OF SPECKLE NOISE IN AN IMAGE
Publication number
20090175557
Publication date
Jul 9, 2009
STC.UNM
OUSSEINI LANKOANDE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFRARED RETINA
Publication number
20090072144
Publication date
Mar 19, 2009
Sanjay Krishna
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND METHOD FOR REDUCTION OF SPECKLE NOISE IN AN IMAGE
Publication number
20080025619
Publication date
Jan 31, 2008
REGENTS OF THE UNIVERSITY OF NEW MEXICO
Ousseini Lankoande
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERSUBBAND DETECTOR WITH AVALANCHE MULTIPLIER REGION
Publication number
20080006816
Publication date
Jan 10, 2008
STC.UNM
Sanjay Krishna
B82 - NANO-TECHNOLOGY
Information
Patent Application
DETECTOR WITH TUNABLE SPECTRAL RESPONSE
Publication number
20070252134
Publication date
Nov 1, 2007
STC.UNM
Sanjay Krishna
G01 - MEASURING TESTING
Information
Patent Application
Intersubband detector with avalanche multiplier region
Publication number
20050211996
Publication date
Sep 29, 2005
Sanjay Krishna
B82 - NANO-TECHNOLOGY
Information
Patent Application
Detector with tunable spectral response
Publication number
20050211873
Publication date
Sep 29, 2005
Sanjay Krishna
G01 - MEASURING TESTING
Information
Patent Application
Uniform, non-disruptive, and radiometrically accurate calibration o...
Publication number
20040206898
Publication date
Oct 21, 2004
Bradley M. Ratliff
G01 - MEASURING TESTING