Makarand S. Shinde

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for adjusting a multi-substrate probe structure
- Patent number 7,845,072
- Issue date Dec 7, 2010
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Grant
Probe card configuration for low mechanical flexural strength elect...
- Patent number 7,825,674
- Issue date Nov 2, 2010
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Grant
Sawing tile corners on probe card substrates
- Patent number 7,692,433
- Issue date Apr 6, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for adjusting an orientation of probes
- Patent number 7,671,614
- Issue date Mar 2, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Mechanically reconfigurable vertical tester interface for IC probing
- Patent number 7,659,736
- Issue date Feb 9, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for compensating thermally induced motion of prob...
- Patent number 7,642,794
- Issue date Jan 5, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for managing thermally induced motion of a pro...
- Patent number 7,592,821
- Issue date Sep 22, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for compensating thermally induced motion of prob...
- Patent number 7,560,941
- Issue date Jul 14, 2009
- FormFactor, Inc.
- Rod Martens
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adjusting a multi-substrate probe structure
- Patent number 7,471,094
- Issue date Dec 30, 2008
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for compensating thermally induced motion of prob...
- Patent number 7,312,618
- Issue date Dec 25, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for managing thermally induced motion of a pro...
- Patent number 7,285,968
- Issue date Oct 23, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Mechanically reconfigurable vertical tester interface for IC probing
- Patent number 7,230,437
- Issue date Jun 12, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for compensating thermally induced motion of prob...
- Patent number 7,119,564
- Issue date Oct 10, 2006
- FormFactor, Inc.
- Rod Martens
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with coplanar daughter card
- Patent number 7,116,119
- Issue date Oct 3, 2006
- FormFactor, Inc.
- Alistair Nicholas Sporck
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for compensating for thermally induced motion of...
- Patent number 7,071,714
- Issue date Jul 4, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Probe card configuration for low mechanical flexural strength elect...
- Patent number 7,071,715
- Issue date Jul 4, 2006
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for compensating thermally induced motion of prob...
- Patent number 6,972,578
- Issue date Dec 6, 2005
- FormFactor, Inc.
- Rod Martens
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with coplanar daughter card
- Patent number 6,856,150
- Issue date Feb 15, 2005
- FormFactor, Inc.
- A. Nicholas Sporck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optimizing Utility Usage by Smart Monitoring
- Publication number 20110082599
- Publication date Apr 7, 2011
- Makarand Shinde
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...
- Publication number 20100000080
- Publication date Jan 7, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ADJUSTING A MULTI-SUBSTRATE PROBE STRUCTURE
- Publication number 20090158586
- Publication date Jun 25, 2009
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Compensating Thermally Induced Motion of Prob...
- Publication number 20080094088
- Publication date Apr 24, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...
- Publication number 20080042668
- Publication date Feb 21, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Sawing tile corners on probe card substrates
- Publication number 20070290705
- Publication date Dec 20, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING
- Publication number 20070229102
- Publication date Oct 4, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROB...
- Publication number 20070139060
- Publication date Jun 21, 2007
- FormFactor, Inc.
- Rod Martens
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Adjusting An Orientation Of Probes
- Publication number 20070126435
- Publication date Jun 7, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for adjusting a multi-substrate probe structure
- Publication number 20060290367
- Publication date Dec 28, 2006
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Managing Thermally Induced Motion Of A Pro...
- Publication number 20060255814
- Publication date Nov 16, 2006
- FORMFACTOR
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Probe card configuration for low mechanical flexural strength elect...
- Publication number 20060244470
- Publication date Nov 2, 2006
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Compensating Thermally Induced Motion Of Prob...
- Publication number 20060238211
- Publication date Oct 26, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method and system for compensating thermally induced motion of prob...
- Publication number 20060001440
- Publication date Jan 5, 2006
- FormFactor, Inc.
- Rod Martens
- G01 - MEASURING TESTING
Information Patent Application
Mechanically reconfigurable vertical tester interface for IC probing
- Publication number 20050277323
- Publication date Dec 15, 2005
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Probe card configuration for low mechanical flexural strength elect...
- Publication number 20050156611
- Publication date Jul 21, 2005
- FormFactor, Inc.
- Makarand S. Shinde
- G01 - MEASURING TESTING
Information Patent Application
Probe card with coplanar daughter card
- Publication number 20050140381
- Publication date Jun 30, 2005
- FormFactor, Inc.
- A. Nicholas Sporck
- G01 - MEASURING TESTING
Information Patent Application
Method and system for compensating thermally induced motion of prob...
- Publication number 20030085721
- Publication date May 8, 2003
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method and system for compensating thermally induced motion of prob...
- Publication number 20030085723
- Publication date May 8, 2003
- Rod Martens
- G01 - MEASURING TESTING
Information Patent Application
Probe card with coplanar daughter card
- Publication number 20020145437
- Publication date Oct 10, 2002
- FormFactor, Inc.
- A. Nicholas Sporck
- G01 - MEASURING TESTING

Makarand S. Shinde

Person

Patents Grantslast 30 patents

Method and apparatus for adjusting a multi-substrate probe structure

Probe card configuration for low mechanical flexural strength elect...

Sawing tile corners on probe card substrates

Apparatus and method for adjusting an orientation of probes

Mechanically reconfigurable vertical tester interface for IC probing

Method and system for compensating thermally induced motion of prob...

Apparatus and method for managing thermally induced motion of a pro...

Method and system for compensating thermally induced motion of prob...

Method and apparatus for adjusting a multi-substrate probe structure

Method and system for compensating thermally induced motion of prob...

Apparatus and method for managing thermally induced motion of a pro...

Mechanically reconfigurable vertical tester interface for IC probing

Method and system for compensating thermally induced motion of prob...

Probe card with coplanar daughter card

Method and system for compensating for thermally induced motion of...

Probe card configuration for low mechanical flexural strength elect...

Method and system for compensating thermally induced motion of prob...

Probe card with coplanar daughter card

Patents Applicationslast 30 patents

Optimizing Utility Usage by Smart Monitoring

APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...

METHOD AND APPARATUS FOR ADJUSTING A MULTI-SUBSTRATE PROBE STRUCTURE

Method and System for Compensating Thermally Induced Motion of Prob...

APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PRO...

Sawing tile corners on probe card substrates

MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING

METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROB...

Apparatus And Method For Adjusting An Orientation Of Probes

Method and apparatus for adjusting a multi-substrate probe structure

Apparatus And Method For Managing Thermally Induced Motion Of A Pro...

Probe card configuration for low mechanical flexural strength elect...

Method And System For Compensating Thermally Induced Motion Of Prob...

Method and system for compensating thermally induced motion of prob...

Mechanically reconfigurable vertical tester interface for IC probing

Probe card configuration for low mechanical flexural strength elect...

Probe card with coplanar daughter card

Method and system for compensating thermally induced motion of prob...

Method and system for compensating thermally induced motion of prob...

Probe card with coplanar daughter card