Maki Kimura

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern evaluation method and pattern evaluation device
- Patent number 9,488,815
- Issue date Nov 8, 2016
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM
- Publication number 20230230886
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Kenji YASUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Microscope System and Measurement Method Using Same
- Publication number 20150235804
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corporation
- Mayuka Osaki
- G02 - OPTICS
Information Patent Application
PATTERN EVALUATION METHOD AND PATTERN EVALUATION DEVICE
- Publication number 20140320627
- Publication date Oct 30, 2014
- Atsushi Miyamoto
- G02 - OPTICS