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Makoto Abe
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Tsukuba-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Shape measurement method and shape measurement apparatus
Patent number
7,595,893
Issue date
Sep 29, 2009
Mitutoyo Corporation
Sotomitsu Hara
G01 - MEASURING TESTING
Information
Patent Grant
Laser tracking interferometer
Patent number
7,388,674
Issue date
Jun 17, 2008
Mitutoyo Corporation
Shinichirou Yanaka
G01 - MEASURING TESTING
Information
Patent Grant
Method of and an apparatus for measuring surface contour
Patent number
5,467,289
Issue date
Nov 14, 1995
Mitutoyo Corporation
Makoto Abe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Shape measurement method and shape measurement apparatus
Publication number
20080068608
Publication date
Mar 20, 2008
Mitutoyo Corporation
Sotomitsu Hara
G01 - MEASURING TESTING
Information
Patent Application
LASER TRACKING INTERFEROMETER
Publication number
20070024861
Publication date
Feb 1, 2007
Mitutoyo Corporation
Shinichirou Yanaka
G01 - MEASURING TESTING