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Makoto Aoshima
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning electron microscope
Patent number
10,361,062
Issue date
Jul 23, 2019
Jeol Ltd.
Tatsuru Kuramoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
10,269,531
Issue date
Apr 23, 2019
Jeol Ltd.
Tatsuru Kuramoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron detecting mechanism and charged particle beam system equip...
Patent number
8,466,416
Issue date
Jun 18, 2013
Jeol Ltd.
Tatsuru Kuramoto
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Scanning Electron Microscope
Publication number
20180261422
Publication date
Sep 13, 2018
JEOL Ltd.
Tatsuru Kuramoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Electron Microscope
Publication number
20180240644
Publication date
Aug 23, 2018
JEOL Ltd.
Tatsuru Kuramoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Detecting Mechanism and Charged Particle Beam System Equip...
Publication number
20120241609
Publication date
Sep 27, 2012
JEOL Ltd.
Tatsuru Kuramoto
H01 - BASIC ELECTRIC ELEMENTS