Makoto Aoshima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 10,361,062
- Issue date Jul 23, 2019
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,269,531
- Issue date Apr 23, 2019
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detecting mechanism and charged particle beam system equip...
- Patent number 8,466,416
- Issue date Jun 18, 2013
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Focused Ion Beam System
- Publication number 20250109481
- Publication date Apr 3, 2025
- JEOL Ltd.
- Noriaki Mizuno
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Scanning Electron Microscope
- Publication number 20180261422
- Publication date Sep 13, 2018
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20180240644
- Publication date Aug 23, 2018
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Detecting Mechanism and Charged Particle Beam System Equip...
- Publication number 20120241609
- Publication date Sep 27, 2012
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS