Makoto Fujino

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection jig, and inspection device
- Patent number 11,933,837
- Issue date Mar 19, 2024
- Nidec-Read Corporation
- Minoru Kato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION JIG, AND INSPECTION DEVICE
- Publication number 20220178987
- Publication date Jun 9, 2022
- Nidec-Read Corporation
- Minoru KATO
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE AND METHOD FOR PRODUCING PROBE STRUCTURE
- Publication number 20200041543
- Publication date Feb 6, 2020
- NIDEC-READ CORPORATION
- Michihisa MAEDA
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF DESIGNING CIRCUIT BOARD INSPECTING JIG, CIRCUIT BOARD INS...
- Publication number 20150310161
- Publication date Oct 29, 2015
- NIDEC-READ CORPORATION
- Michio KAIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE, TESTING HEAD HAVING A PLURALITY OF PROBES, AND CIRCUIT BOARD...
- Publication number 20070264878
- Publication date Nov 15, 2007
- NIDEC-READ CORPORATION
- Kosuke Hirobe
- G01 - MEASURING TESTING