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MAKOTO HASEYAMA
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TOKYO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
Patent number
8,759,119
Issue date
Jun 24, 2014
Fujitsu Semiconductor Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
Patent number
8,404,496
Issue date
Mar 26, 2013
Fujitsu Semiconductor Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Test method of semiconductor devices
Patent number
7,304,487
Issue date
Dec 4, 2007
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Device testing contactor, method of producing the same, and device...
Patent number
7,196,530
Issue date
Mar 27, 2007
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit contactor, and method and apparatus for producti...
Patent number
7,174,629
Issue date
Feb 13, 2007
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor testing device
Patent number
7,161,370
Issue date
Jan 9, 2007
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having an alignment mark formed by the same ma...
Patent number
7,112,889
Issue date
Sep 26, 2006
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor, a method of manufacturing the contactor and a device and...
Patent number
7,028,398
Issue date
Apr 18, 2006
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor apparatus for semiconductor devices and a test method of...
Patent number
6,975,126
Issue date
Dec 13, 2005
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor testing device
Patent number
6,882,169
Issue date
Apr 19, 2005
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor for semiconductor devices, a testing apparatus using such...
Patent number
6,781,395
Issue date
Aug 24, 2004
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor testing device
Patent number
6,661,247
Issue date
Dec 9, 2003
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Device testing contactor, method of producing the same, and device...
Patent number
6,643,922
Issue date
Nov 11, 2003
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor, a method of manufacturing the contactor and a device and...
Patent number
6,630,839
Issue date
Oct 7, 2003
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device testing method, using a spring-biased transfor...
Patent number
6,624,645
Issue date
Sep 23, 2003
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor for semiconductor devices, a testing apparatus using such...
Patent number
6,603,325
Issue date
Aug 5, 2003
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit contactor, and method and apparatus for producti...
Patent number
6,555,764
Issue date
Apr 29, 2003
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
IC socket, a test method using the same and an IC socket mounting m...
Patent number
6,535,002
Issue date
Mar 18, 2003
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Device testing contactor, method of producing the same, and device...
Patent number
6,512,386
Issue date
Jan 28, 2003
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor for semiconductor devices, a testing apparatus using such...
Patent number
6,466,046
Issue date
Oct 15, 2002
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor element testing carrier using a membrane contactor an...
Patent number
6,445,200
Issue date
Sep 3, 2002
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for passive optical characterization of semico...
Patent number
6,249,135
Issue date
Jun 19, 2001
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
IC socket, a test method using the same and an IC socket mounting m...
Patent number
6,229,320
Issue date
May 8, 2001
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit testing device
Patent number
6,191,604
Issue date
Feb 20, 2001
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Grant
Test board and a test method using the same providing improved elec...
Patent number
6,046,598
Issue date
Apr 4, 2000
Fujitsu Limited
Naomi Miyaji
G01 - MEASURING TESTING
Information
Patent Grant
Electrical connecting device, and semiconductor device testing method
Patent number
6,033,233
Issue date
Mar 7, 2000
Fujitsu Limited
Makoto Haseyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF TESTING A SEMICONDUCTOR DEVICE AND SUCTIONING A SEMICONDU...
Publication number
20130171748
Publication date
Jul 4, 2013
FUJITSU SEMICONDUCTOR LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device having an alignment mark formed by the same ma...
Publication number
20060279003
Publication date
Dec 14, 2006
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Test method of semiconductor devices
Publication number
20060028223
Publication date
Feb 9, 2006
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor testing device
Publication number
20050162180
Publication date
Jul 28, 2005
FIJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor testing device
Publication number
20040124866
Publication date
Jul 1, 2004
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor apparatus for semiconductor devices and a test method of...
Publication number
20040070961
Publication date
Apr 15, 2004
FUJITSU LIMITED
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Application
Device testing contactor, method of producing the same, and device...
Publication number
20040070412
Publication date
Apr 15, 2004
FUJITSU LIMITED
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor, a method of manufacturing the contactor and a device and...
Publication number
20040070010
Publication date
Apr 15, 2004
FUJITSU LIMITED
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor for semiconductor devices, a testing apparatus using such...
Publication number
20030197501
Publication date
Oct 23, 2003
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Integrated circuit contactor, and method and apparatus for producti...
Publication number
20030132027
Publication date
Jul 17, 2003
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Device testing contactor, method of producing the same, and device...
Publication number
20030090281
Publication date
May 15, 2003
FUJITSU LIMITED
Makoto Haseyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor for semiconductor devices, a testing apparatus using such...
Publication number
20020190741
Publication date
Dec 19, 2002
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
DEVICE TESTING CONTACTOR, METHOD OF PRODUCING THE SAME, AND DEVICE...
Publication number
20020140444
Publication date
Oct 3, 2002
MAKOTO HASEYAMA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE TESTING METHOD, USING A SPRING-BIASED TRANSFOR...
Publication number
20020060579
Publication date
May 23, 2002
MAKOTO HASEYAMA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR ELEMENT TESTING CARRIER USING A MEMBRANE CONTACTOR AN...
Publication number
20010040462
Publication date
Nov 15, 2001
MAKOTO HASEYAMA
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor testing device
Publication number
20010011724
Publication date
Aug 9, 2001
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
IC socket, a test method using the same and an IC socket mounting m...
Publication number
20010011898
Publication date
Aug 9, 2001
FUJITSU LIMITED
Makoto Haseyama
G01 - MEASURING TESTING