Makoto Hatakenaka

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Unevenness correction data generation device
- Patent number 12,159,605
- Issue date Dec 3, 2024
- IIX Inc.
- Makoto Hatakenaka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Panel drive circuit
- Patent number 12,148,402
- Issue date Nov 19, 2024
- IIX Inc.
- Makoto Hatakenaka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Input signal correction device
- Patent number 11,990,104
- Issue date May 21, 2024
- IIX Inc.
- Makoto Hatakenaka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Input signal correction device
- Patent number 11,823,610
- Issue date Nov 21, 2023
- IIX Inc.
- Makoto Hatakenaka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Unevenness correction system, unevenness correction apparatus and p...
- Patent number 10,750,148
- Issue date Aug 18, 2020
- IIX Inc.
- Makoto Hatakenaka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Information device including main processing circuit, interface cir...
- Patent number 7,984,223
- Issue date Jul 19, 2011
- Renesas Electronics Corporation
- Hideo Nagano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Information device including main processing circuit, interface cir...
- Patent number 7,716,410
- Issue date May 11, 2010
- Renesas Technology Corp.
- Hideo Nagano
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Memory circuit
- Patent number 7,237,175
- Issue date Jun 26, 2007
- Renesas Technology Corp.
- Makoto Hatakenaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device comprising RAM with command...
- Patent number RE39579
- Issue date Apr 17, 2007
- Renesas Technology Corp.
- Makoto Hatakenaka
- 714 - Error detection/correction and fault detection/recovery
Information Patent Grant
Semiconductor device downsizing its built-in driver
- Patent number 6,756,803
- Issue date Jun 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Miura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit for multi-chip package with means...
- Patent number 6,724,237
- Issue date Apr 20, 2004
- Renesas Technology Corp.
- Takekazu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of testing a semiconductor memory device
- Patent number 6,715,117
- Issue date Mar 30, 2004
- Renesas Technology Corp.
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Grant
Line delay generator using one-port RAM
- Patent number 6,570,572
- Issue date May 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Miura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device allowing accurate evaluatio...
- Patent number 6,512,707
- Issue date Jan 28, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Miura
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-bank semiconductor memory device suitable for integration wit...
- Patent number 6,310,815
- Issue date Oct 30, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tadato Yamagata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device with large internal bus wid...
- Patent number 6,163,493
- Issue date Dec 19, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Tadato Yamagata
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 6,092,227
- Issue date Jul 18, 2000
- Mitsubishi Electric System Lsi Design Corporation
- Hideki Toki
- G11 - INFORMATION STORAGE
Information Patent Grant
Field effect transistor array including doped two-cell isolation re...
- Patent number 6,043,522
- Issue date Mar 28, 2000
- Mitsubishi Electric System Lsi Design Corporation
- Michio Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit including a capacitor and a fuse e...
- Patent number 6,040,614
- Issue date Mar 21, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Akira Kitaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 6,025,733
- Issue date Feb 15, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Tuyoshi Saitoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having improved bit line structure
- Patent number 5,973,953
- Issue date Oct 26, 1999
- Mitsubishi Electric System Lsi Design Corporation
- Takekazu Yamashita
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable delay circuit for varying delay time and pulse width
- Patent number 5,949,268
- Issue date Sep 7, 1999
- Misubishi Denki Kabushiki Kaisha
- Manabu Miura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory device capable of block writing in large bus w...
- Patent number 5,930,194
- Issue date Jul 27, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tadato Yamagata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device comprising synchronous DRAM...
- Patent number 5,910,181
- Issue date Jun 8, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Hatakenaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Phase-locked circuit and interated circuit device
- Patent number 5,539,344
- Issue date Jul 23, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Hatakenaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronized clock generating apparatus
- Patent number 5,534,805
- Issue date Jul 9, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Yukio Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronized clock generating apparatus
- Patent number 5,491,438
- Issue date Feb 13, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Yukio Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Period measuring device
- Patent number 5,487,097
- Issue date Jan 23, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Hatakenaka
- G01 - MEASURING TESTING
Information Patent Grant
Synchronizing pulse generating circuit
- Patent number 5,459,419
- Issue date Oct 17, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Hatakenaka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
PANEL DRIVE CIRCUIT
- Publication number 20240233669
- Publication date Jul 11, 2024
- IIX INC.
- Makoto HATAKENAKA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
PANEL DRIVE CIRCUIT
- Publication number 20240135894
- Publication date Apr 25, 2024
- IIX INC.
- Makoto HATAKENAKA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
UNEVENNESS CORRECTION DATA GENERATION DEVICE
- Publication number 20240071337
- Publication date Feb 29, 2024
- IIX INC.
- Makoto HATAKENAKA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
INPUT SIGNAL CORRECTION DEVICE
- Publication number 20230395038
- Publication date Dec 7, 2023
- IIX INC.
- Makoto HATAKENAKA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
INPUT SIGNAL CORRECTION DEVICE
- Publication number 20230162648
- Publication date May 25, 2023
- IIX INC.
- Makoto HATAKENAKA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
UNEVENNESS CORRECTION DATA GENERATION DEVICE
- Publication number 20200184883
- Publication date Jun 11, 2020
- IIX INC.
- Hiroshi MURASE
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
UNEVENNESS CORRECTION SYSTEM, UNEVENNESS CORRECTION APPARATUS AND P...
- Publication number 20190037188
- Publication date Jan 31, 2019
- IIX INC.
- Makoto Hatakenaka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFORMATION DEVICE INCLUDING MAIN PROCESSING CIRCUIT, INTERFACE CIR...
- Publication number 20100191883
- Publication date Jul 29, 2010
- Renesas Technology Corp.
- Hideo Nagano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Information device
- Publication number 20070091122
- Publication date Apr 26, 2007
- Renesas Technology Corporation
- Hideo Nagano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE DOWNSIZING ITS BUILT-IN DRIVER
- Publication number 20040027150
- Publication date Feb 12, 2004
- Manabu Miura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device allowing accurate evaluatio...
- Publication number 20030067815
- Publication date Apr 10, 2003
- Manabu Miura
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit and multi-chip package
- Publication number 20030057775
- Publication date Mar 27, 2003
- Takekazu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory circuit
- Publication number 20030046632
- Publication date Mar 6, 2003
- Makoto Hatakenaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated circuit facilitating its unit test
- Publication number 20020162060
- Publication date Oct 31, 2002
- Makoto Hatakenaka
- G01 - MEASURING TESTING
Information Patent Application
Method of testing a semiconductor memory device
- Publication number 20020048856
- Publication date Apr 25, 2002
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device allowing accurate evaluatio...
- Publication number 20010055226
- Publication date Dec 27, 2001
- Manabu Miura
- G11 - INFORMATION STORAGE

Makoto Hatakenaka

Person

Patents Grantslast 30 patents

Unevenness correction data generation device

Panel drive circuit

Input signal correction device

Input signal correction device

Unevenness correction system, unevenness correction apparatus and p...

Information device including main processing circuit, interface cir...

Information device including main processing circuit, interface cir...

Memory circuit

Semiconductor integrated circuit device comprising RAM with command...

Semiconductor device downsizing its built-in driver

Semiconductor integrated circuit for multi-chip package with means...

Method of testing a semiconductor memory device

Line delay generator using one-port RAM

Semiconductor integrated circuit device allowing accurate evaluatio...

Multi-bank semiconductor memory device suitable for integration wit...

Semiconductor integrated circuit device with large internal bus wid...

Test circuit

Field effect transistor array including doped two-cell isolation re...

Semiconductor integrated circuit including a capacitor and a fuse e...

Semiconductor memory device

Semiconductor memory device having improved bit line structure

Variable delay circuit for varying delay time and pulse width

Semiconductor memory device capable of block writing in large bus w...

Semiconductor integrated circuit device comprising synchronous DRAM...

Phase-locked circuit and interated circuit device

Synchronized clock generating apparatus

Synchronized clock generating apparatus

Period measuring device

Synchronizing pulse generating circuit

Patents Applicationslast 30 patents

PANEL DRIVE CIRCUIT

PANEL DRIVE CIRCUIT

UNEVENNESS CORRECTION DATA GENERATION DEVICE

INPUT SIGNAL CORRECTION DEVICE

INPUT SIGNAL CORRECTION DEVICE

UNEVENNESS CORRECTION DATA GENERATION DEVICE

UNEVENNESS CORRECTION SYSTEM, UNEVENNESS CORRECTION APPARATUS AND P...

INFORMATION DEVICE INCLUDING MAIN PROCESSING CIRCUIT, INTERFACE CIR...

Information device

SEMICONDUCTOR DEVICE DOWNSIZING ITS BUILT-IN DRIVER

Semiconductor integrated circuit device allowing accurate evaluatio...

Semiconductor integrated circuit and multi-chip package

Memory circuit

Integrated circuit facilitating its unit test

Method of testing a semiconductor memory device

Semiconductor integrated circuit device allowing accurate evaluatio...