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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Storage battery management device and method
Patent number
11,549,987
Issue date
Jan 10, 2023
Kabushiki Kaisha Toshiba
Makoto Ide
G01 - MEASURING TESTING
Information
Patent Grant
Internal condition estimating system and estimating method
Patent number
10,338,152
Issue date
Jul 2, 2019
Kabushiki Kaisha Toshiba
Makoto Ide
G01 - MEASURING TESTING
Information
Patent Grant
Electricity storage system and method of estimating characteristic...
Patent number
10,261,132
Issue date
Apr 16, 2019
Kabushiki Kaisha Toshiba
Masahiro Tohara
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
STORAGE BATTERY MANAGEMENT DEVICE, STORAGE BATTERY MANAGEMENT METHO...
Publication number
20240088688
Publication date
Mar 14, 2024
Kabushiki Kaisha Toshiba
Makoto IDE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STORAGE BATTERY MANAGEMENT DEVICE AND STORAGE BATTERY MANAGEMENT ME...
Publication number
20240069106
Publication date
Feb 29, 2024
Kabushiki Kaisha Toshiba
Yukitaka MONDEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STORAGE BATTERY CONTROL DEVICE AND STORAGE BATTERY CONTROL METHOD
Publication number
20240055882
Publication date
Feb 15, 2024
Kabushiki Kaisha Toshiba
Masako KIUCHI
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
STORAGE BATTERY MANAGEMENT DEVICE AND METHOD
Publication number
20210349149
Publication date
Nov 11, 2021
Kabushiki Kaisha Toshiba
Makoto IDE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRICITY STORAGE SYSTEM AND METHOD OF ESTIMATING CHARACTERISTIC...
Publication number
20180149703
Publication date
May 31, 2018
KABUSHIKI KAISHA TOSHIBA
Masahiro TOHARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STORAGE SYSTEM, STORAGE CONTROL METHOD, AND STORAGE CONTROL PROGRAM
Publication number
20180067167
Publication date
Mar 8, 2018
KABUSHIKI KAISHA TOSHIBA
Makoto IDE
G01 - MEASURING TESTING
Information
Patent Application
INTERNAL CONDITION ESTIMATING SYSTEM AND ESTIMATING METHOD
Publication number
20160025814
Publication date
Jan 28, 2016
Kabushiki Kaisha Toshiba
Makoto Ide
G01 - MEASURING TESTING