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Makoto KAIEDA
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Miyazaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Image measuring method and apparatus
Patent number
11,257,205
Issue date
Feb 22, 2022
Mitutoyo Corporation
Gyokubu Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image measuring apparatus and user interface for management of cali...
Patent number
10,416,863
Issue date
Sep 17, 2019
Mitutoyo Corporation
Makoto Kaieda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Edge detection bias correction value calculation method, edge detec...
Patent number
10,102,631
Issue date
Oct 16, 2018
Mitutoyo Corporation
Hiroyuki Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hardness test apparatus and hardness testing method
Patent number
10,024,774
Issue date
Jul 17, 2018
Mitutoyo Corporation
Fumihiko Koshimizu
G01 - MEASURING TESTING
Information
Patent Grant
Hardness test apparatus and hardness testing method
Patent number
10,001,432
Issue date
Jun 19, 2018
Mitutoyo Corporation
Eiji Furuta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Slit width adjusting device and microscope laser processing apparatus
Patent number
8,680,428
Issue date
Mar 25, 2014
Mitutoyo Corporation
Hidemitsu Asano
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE
Publication number
20170178315
Publication date
Jun 22, 2017
MITUTOYO CORPORATION
Gyokubu CHO
G01 - MEASURING TESTING
Information
Patent Application
HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD
Publication number
20170074765
Publication date
Mar 16, 2017
MITUTOYO CORPORATION
Fumihiko KOSHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD
Publication number
20170074764
Publication date
Mar 16, 2017
MITUTOYO CORPORATION
Eiji FURUTA
G01 - MEASURING TESTING
Information
Patent Application
EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...
Publication number
20160295207
Publication date
Oct 6, 2016
MITUTOYO CORPORATION
Hiroyuki YOSHIDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE MEASURING APPARATUS AND GUI PROGRAM FOR IMAGE MEASURING APPAR...
Publication number
20160018976
Publication date
Jan 21, 2016
MITUTOYO CORPORATION
Makoto KAIEDA
G02 - OPTICS
Information
Patent Application
IMAGE MEASURING DEVICE
Publication number
20150287177
Publication date
Oct 8, 2015
MITUTOYO CORPORATION
Makoto KAIEDA
G01 - MEASURING TESTING
Information
Patent Application
Slit width adjusting device and microscope laser processing apparatus
Publication number
20090314749
Publication date
Dec 24, 2009
Mitutoyo Corporation
Hidemitsu Asano
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR