Makoto Kaneko

Person

Tochigi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 9,176,074
- Issue date Nov 3, 2015
- Kabushiki Kaisha Toshiba
- Takayoshi Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 8,649,591
- Issue date Feb 11, 2014
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for synthesizing a medical image and corresponding numeri...
- Patent number 5,396,347
- Issue date Mar 7, 1995
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Recursive filter and image display apparatus including the same
- Patent number 5,018,179
- Issue date May 21, 1991
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image processing apparatus
- Patent number 4,783,832
- Issue date Nov 8, 1988
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processor with automatic setting of window width and level fo...
- Patent number 4,688,175
- Issue date Aug 18, 1987
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray diagnostic apparatus
- Patent number 4,644,395
- Issue date Feb 17, 1987
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shouichi Itou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20140212023
- Publication date Jul 31, 2014
- KABUSHIKI KAISHA TOSHIBA
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130063721
- Publication date Mar 14, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242985
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Mitsutoshi WATABIKI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120243770
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242995
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G01 - MEASURING TESTING

Makoto Kaneko

Person

Patents Grantslast 30 patents

Pattern inspection method and pattern inspection apparatus

Pattern inspection apparatus and pattern inspection method

Apparatus for synthesizing a medical image and corresponding numeri...

Recursive filter and image display apparatus including the same

Image processing apparatus

Image processor with automatic setting of window width and level fo...

X-ray diagnostic apparatus

Patents Applicationslast 30 patents

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS AND METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD