Makoto Kobayashi

Person

Sanda, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer flatness evaluation method, wafer flatness evaluation apparat...
- Patent number 7,474,386
- Issue date Jan 6, 2009
- Kabushiki Kaisha Toshiba
- Tadahito Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing SOI wafer
- Patent number 7,435,662
- Issue date Oct 14, 2008
- Shin-Etsu Handotai Co., Ltd.
- Makoto Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer flatness evaluation method, wafer flatness evaluation apparat...
- Patent number 7,365,830
- Issue date Apr 29, 2008
- Kabushiki Kaisha Toshiba
- Tadahito Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Wafer flatness evaluation method, wafer flatness evaluation apparat...
- Patent number 7,230,680
- Issue date Jun 12, 2007
- Kabushiki Kaisha Toshiba
- Tadahito Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for editing video data
- Patent number 7,149,408
- Issue date Dec 12, 2006
- Kabushiki Kaisha Toshiba
- Makoto Kobayashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer shape evaluating method and device producing method, wafer an...
- Patent number 6,828,163
- Issue date Dec 7, 2004
- Shin-Etsu Handotai Co., Ltd.
- Makoto Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Radio device control terminal apparatus, radio system and multimedi...
- Patent number 6,782,241
- Issue date Aug 24, 2004
- Kabushiki Kaisha Toshiba
- Makoto Kobayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of making IC card
- Patent number 5,520,863
- Issue date May 28, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Katsunori Ochi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable semiconductor device with resin
- Patent number 5,461,256
- Issue date Oct 24, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Akira Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC card including frame with lateral hole for injecting encapsulati...
- Patent number 5,416,358
- Issue date May 16, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Katsunori Ochi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing IC card
- Patent number 5,346,576
- Issue date Sep 13, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC card
- Patent number 5,250,341
- Issue date Oct 5, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Kobayashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MOBILE RADIO TERMINAL
- Publication number 20090245175
- Publication date Oct 1, 2009
- Kabushiki Kaisha Toshiba
- Makoto KOBAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Wafer flatness evaluation method, wafer flatness evaluation apparat...
- Publication number 20070177126
- Publication date Aug 2, 2007
- Kabushiki Kaisha Toshiba
- Tadahito Fujisawa
- G01 - MEASURING TESTING
Information Patent Application
Wafer flatness evaluation method, wafer flatness evaluation apparat...
- Publication number 20070177127
- Publication date Aug 2, 2007
- Kabushiki Kaisha Toshiba
- Tadahito Fujisawa
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing soi wafer
- Publication number 20060024915
- Publication date Feb 2, 2006
- Shin-Etsu Handotai Co., Ltd.
- Makoto Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer flatness evaluation method, wafer flatness evaluation apparat...
- Publication number 20040185662
- Publication date Sep 23, 2004
- Tadahito Fujisawa
- G01 - MEASURING TESTING
Information Patent Application
Wafer shape evaluating method and device producing method, wafer an...
- Publication number 20030023402
- Publication date Jan 30, 2003
- Makoto Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for editing video data
- Publication number 20030002852
- Publication date Jan 2, 2003
- Kabushiki Kaisha Toshiba
- Makoto Kobayashi
- G11 - INFORMATION STORAGE

Makoto Kobayashi

Person

Patents Grantslast 30 patents

Wafer flatness evaluation method, wafer flatness evaluation apparat...

Method for manufacturing SOI wafer

Wafer flatness evaluation method, wafer flatness evaluation apparat...

Wafer flatness evaluation method, wafer flatness evaluation apparat...

Method and apparatus for editing video data

Wafer shape evaluating method and device producing method, wafer an...

Radio device control terminal apparatus, radio system and multimedi...

Method of making IC card

Portable semiconductor device with resin

IC card including frame with lateral hole for injecting encapsulati...

Method of manufacturing IC card

IC card

Patents Applicationslast 30 patents

MOBILE RADIO TERMINAL

Wafer flatness evaluation method, wafer flatness evaluation apparat...

Wafer flatness evaluation method, wafer flatness evaluation apparat...

Method for manufacturing soi wafer

Wafer flatness evaluation method, wafer flatness evaluation apparat...

Wafer shape evaluating method and device producing method, wafer an...

Method and apparatus for editing video data