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Makoto Kono
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Chinoshi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Spectroscopic measurement device and spectrometry system
Patent number
11,060,911
Issue date
Jul 13, 2021
Hamamatsu Photonics K.K.
Makoto Kono
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic measurement device and spectrometry system
Patent number
10,928,249
Issue date
Feb 23, 2021
Hamamatsu Photonics K.K.
Makoto Kono
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic measurement device and spectrometry system
Patent number
10,520,362
Issue date
Dec 31, 2019
Hamamatsu Photonics K.K.
Makoto Kono
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing liquid crystal display device
Patent number
6,623,913
Issue date
Sep 23, 2003
Chisso Corporation
Satoshi Tanioka
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Thin film coater and coating method
Patent number
6,322,956
Issue date
Nov 27, 2001
Chisso Corporation
Satoshi Tanioka
G02 - OPTICS
Information
Patent Grant
Method for treating an aligning film for a liquid crystal display e...
Patent number
5,798,810
Issue date
Aug 25, 1998
Chisso Corporation
Satoshi Tanioka
G02 - OPTICS
Information
Patent Grant
Method for treating an aligning film for a liquid crystal display e...
Patent number
5,625,475
Issue date
Apr 29, 1997
Chisso Corporation
Satoshi Tanioka
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROMETRY SYSTEM
Publication number
20190368930
Publication date
Dec 5, 2019
Hamamatsu Photonics K.K.
Makoto KONO
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROMETRY SYSTEM
Publication number
20190277696
Publication date
Sep 12, 2019
Hamamatsu Photonics K.K.
Makoto KONO
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROMETRY SYSTEM
Publication number
20190277697
Publication date
Sep 12, 2019
Hamamatsu Photonics K.K.
Makoto KONO
G01 - MEASURING TESTING
Information
Patent Application
Thin film coating apparatus and method, and method for producing li...
Publication number
20020018966
Publication date
Feb 14, 2002
Satoshi Tanioka
G02 - OPTICS