Makoto Kurosawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Waveform generator, waveform generating device, test apparatus, and...
- Patent number 8,060,327
- Issue date Nov 15, 2011
- Advantest Corporation
- Makoto Kurosawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waveform generator, waveform generating device, test apparatus, and...
- Patent number 7,885,776
- Issue date Feb 8, 2011
- Advantest Corporation
- Makoto Kurosawa
- G01 - MEASURING TESTING
Information Patent Grant
Waveform generator, waveform generation apparatus, test apparatus a...
- Patent number 7,805,273
- Issue date Sep 28, 2010
- Advantest Corporation
- Makoto Kurosawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inverse characteristic measuring apparatus, distortion compensation...
- Patent number 7,683,631
- Issue date Mar 23, 2010
- Advantest Corporation
- Makoto Kurosawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase measurement device, method, program, and recording medium
- Patent number 7,466,141
- Issue date Dec 16, 2008
- Advantest Corporation
- Makoto Kurosawa
- G01 - MEASURING TESTING
Information Patent Grant
Frequency analyzing method, frequency analyzing apparatus, and spec...
- Patent number 6,979,993
- Issue date Dec 27, 2005
- Advantest Corporation
- Makoto Kurosawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Correlation function measuring method and apparatus
- Patent number 6,594,605
- Issue date Jul 15, 2003
- Advantest Corp.
- Makoto Kurosawa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAVEFORM GENERATOR, WAVEFORM GENERATION APPARATUS, TEST APPARATUS A...
- Publication number 20090204357
- Publication date Aug 13, 2009
- Advantest Corporation
- Makoto Kurosawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAVEFORM GENERATOR, WAVEFORM GENERATING DEVICE, TEST APPARATUS, AND...
- Publication number 20090027134
- Publication date Jan 29, 2009
- Advantest Corporation
- Makoto Kurosawa
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM GENERATOR, WAVEFORM GENERATING DEVICE, TEST APPARATUS, AND...
- Publication number 20090027135
- Publication date Jan 29, 2009
- Advantest Corporation
- Makoto Kurosawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inverse Characteristic Measuring Apparatus, Distortion Compensation...
- Publication number 20080036470
- Publication date Feb 14, 2008
- Advantest Corporation
- Makoto Kurosawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Phase Measurement Device, Method , Program, And Recording Medium
- Publication number 20080018322
- Publication date Jan 24, 2008
- Advantest Corporation
- Makoto Kurosawa
- G01 - MEASURING TESTING
Information Patent Application
Frequency analyzing method, frequency analyzing apparatus, and spec...
- Publication number 20040100244
- Publication date May 27, 2004
- Makoto Kurosawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Correlation function measuring method and apparatus
- Publication number 20010020220
- Publication date Sep 6, 2001
- Makoto Kurosawa
- G06 - COMPUTING CALCULATING COUNTING

Makoto Kurosawa

Person

Patents Grantslast 30 patents

Waveform generator, waveform generating device, test apparatus, and...

Waveform generator, waveform generating device, test apparatus, and...

Waveform generator, waveform generation apparatus, test apparatus a...

Inverse characteristic measuring apparatus, distortion compensation...

Phase measurement device, method, program, and recording medium

Frequency analyzing method, frequency analyzing apparatus, and spec...

Correlation function measuring method and apparatus

Patents Applicationslast 30 patents

WAVEFORM GENERATOR, WAVEFORM GENERATION APPARATUS, TEST APPARATUS A...

WAVEFORM GENERATOR, WAVEFORM GENERATING DEVICE, TEST APPARATUS, AND...

WAVEFORM GENERATOR, WAVEFORM GENERATING DEVICE, TEST APPARATUS, AND...

Inverse Characteristic Measuring Apparatus, Distortion Compensation...

Phase Measurement Device, Method , Program, And Recording Medium

Frequency analyzing method, frequency analyzing apparatus, and spec...

Correlation function measuring method and apparatus