Makoto Matsuhama

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor laser device and analysis apparatus
- Patent number 11,949,210
- Issue date Apr 2, 2024
- Horiba, Ltd.
- Makoto Matsuhama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor laser
- Patent number 11,374,380
- Issue date Jun 28, 2022
- Horiba, Ltd.
- Tomoji Terakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor laser element, and semiconduc...
- Patent number 11,056,853
- Issue date Jul 6, 2021
- Horiba, Ltd.
- Makoto Matsuhama
- G01 - MEASURING TESTING
Information Patent Grant
Thermal conductivity sensor
- Patent number 8,302,459
- Issue date Nov 6, 2012
- HORIBA, Ltd.
- Makoto Matsuhama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR LASER DEVICE
- Publication number 20240146020
- Publication date May 2, 2024
- HORIBA, LTD.
- Yusuke AWANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASER ELEMENT, SEMICONDUCTOR LASER DEVICE, SEMICONDUC...
- Publication number 20240030683
- Publication date Jan 25, 2024
- HORIBA, LTD.
- Makoto MATSUHAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASER
- Publication number 20210006037
- Publication date Jan 7, 2021
- HORIBA, LTD.
- Tomoji Terakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASER DEVICE AND ANALYSIS APPARATUS
- Publication number 20200287349
- Publication date Sep 10, 2020
- Horiba, Ltd.
- Makoto MATSUHAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR LASER ELEMENT, AND SEMICONDUC...
- Publication number 20190356108
- Publication date Nov 21, 2019
- Horiba, Ltd.
- Makoto MATSUHAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL CONDUCTIVITY SENSOR
- Publication number 20100242573
- Publication date Sep 30, 2010
- HORIBA LTD.
- Makoto Matsuhama
- G01 - MEASURING TESTING