Makoto Nagata

Person

Hiroshima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
On-chip monitor circuit and semiconductor chip
- Patent number 10,776,484
- Issue date Sep 15, 2020
- National University Corporation Kobe University
- Makoto Nagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing signal generator circuit for use in signal waveform measurem...
- Patent number 8,144,045
- Issue date Mar 27, 2012
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Timing analysis apparatus and method for semiconductor integrated c...
- Patent number 8,020,130
- Issue date Sep 13, 2011
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit for detecting and measuring noise in semiconductor integrat...
- Patent number 7,667,477
- Issue date Feb 23, 2010
- The New Industry Research Organization
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Grant
On-chip signal waveform measurement apparatus for measuring signal...
- Patent number 7,609,100
- Issue date Oct 27, 2009
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Grant
On-chip signal waveform measurement apparatus for measuring signal...
- Patent number 7,332,916
- Issue date Feb 19, 2008
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing a source current waveform in a s...
- Patent number 7,039,536
- Issue date May 2, 2006
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing structures
- Patent number 6,661,022
- Issue date Dec 9, 2003
- Japan Science and Technology Corporation
- Takashi Morie
- G11 - INFORMATION STORAGE
Information Patent Grant
Pulse modulation operation circuit
- Patent number 6,157,672
- Issue date Dec 5, 2000
- President of Hiroshima University
- Atsushi Iwata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low switching noise logic circuit
- Patent number 6,144,217
- Issue date Nov 7, 2000
- Semiconductor Technology Academic Research Center
- Atsushi Iwata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for processing two-dimensional information
- Patent number 6,088,490
- Issue date Jul 11, 2000
- President of Hiroshima University
- Atsushi Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pulse width modulation operation circuit
- Patent number 5,889,424
- Issue date Mar 30, 1999
- President of Hiroshima University
- Atsushi Iwata
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ON-CHIP MONITOR CIRCUIT AND SEMICONDUCTOR CHIP
- Publication number 20180004944
- Publication date Jan 4, 2018
- NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Makoto NAGATA
- G01 - MEASURING TESTING
Information Patent Application
TIMING SIGNAL GENERATOR CIRCUIT FOR USE IN SIGNAL WAVEFORM MEASUREM...
- Publication number 20120001785
- Publication date Jan 5, 2012
- Makoto NAGATA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TIMING ANALYSIS APPARATUS AND METHOD FOR SEMICONDUCTOR INTEGRATED C...
- Publication number 20090106720
- Publication date Apr 23, 2009
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
On-chip signal waveform measurement apparatus for measuring signal...
- Publication number 20070262799
- Publication date Nov 15, 2007
- SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Application
Circuit for detecting and measuring noise in semiconductor integrat...
- Publication number 20060221531
- Publication date Oct 5, 2006
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Application
On-chip signal waveform measurement apparatus for measuring signal...
- Publication number 20060197697
- Publication date Sep 7, 2006
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Application
Method of analyzing operation of semiconductor integrated circuit d...
- Publication number 20060091550
- Publication date May 4, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kenji Shimazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for analyzing a source current waveform in a s...
- Publication number 20020147555
- Publication date Oct 10, 2002
- Semiconductor Technology Academic Research Center
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Application
Information processing structures
- Publication number 20020134996
- Publication date Sep 26, 2002
- Takashi Morie
- B82 - NANO-TECHNOLOGY

Makoto Nagata

Person

Patents Grantslast 30 patents

On-chip monitor circuit and semiconductor chip

Timing signal generator circuit for use in signal waveform measurem...

Timing analysis apparatus and method for semiconductor integrated c...

Circuit for detecting and measuring noise in semiconductor integrat...

On-chip signal waveform measurement apparatus for measuring signal...

On-chip signal waveform measurement apparatus for measuring signal...

Method and apparatus for analyzing a source current waveform in a s...

Information processing structures

Pulse modulation operation circuit

Low switching noise logic circuit

Apparatus for processing two-dimensional information

Pulse width modulation operation circuit

Patents Applicationslast 30 patents

ON-CHIP MONITOR CIRCUIT AND SEMICONDUCTOR CHIP

TIMING SIGNAL GENERATOR CIRCUIT FOR USE IN SIGNAL WAVEFORM MEASUREM...

TIMING ANALYSIS APPARATUS AND METHOD FOR SEMICONDUCTOR INTEGRATED C...

On-chip signal waveform measurement apparatus for measuring signal...

Circuit for detecting and measuring noise in semiconductor integrat...

On-chip signal waveform measurement apparatus for measuring signal...

Method of analyzing operation of semiconductor integrated circuit d...

Method and apparatus for analyzing a source current waveform in a s...

Information processing structures