Makoto Nishihara

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle radiation apparatus
- Patent number 9,601,307
- Issue date Mar 21, 2017
- Hitachi High-Technologies Corporation
- Seiichiro Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus for removing charges developed on a...
- Patent number 9,202,665
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Matsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,105,446
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Yasushi Ebizuka
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Charged particle beam scanning method and charged particle beam app...
- Patent number 8,338,781
- Issue date Dec 25, 2012
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Template creation method and image processor therefor
- Patent number 8,180,140
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Kyoungmo Yang
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam scanning method and charged particle beam app...
- Patent number 7,935,925
- Issue date May 3, 2011
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Radiation Apparatus
- Publication number 20150371814
- Publication date Dec 24, 2015
- Hitachi High-Technologies Corporation
- Seiichiro KANNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150097123
- Publication date Apr 9, 2015
- Hitachi High-Technologies Corporation
- Yasushi Ebizuka
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140027635
- Publication date Jan 30, 2014
- Hiroyuki Matsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMATION METHOD AND IMAGE FORMATION DEVICE
- Publication number 20110286685
- Publication date Nov 24, 2011
- Makoto Nishihara
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SCANNING METHOD AND CHARGED PARTICLE BEAM APP...
- Publication number 20110174975
- Publication date Jul 21, 2011
- Hitachi High-Technologies Corporation
- Yuko SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPLATE CREATION METHOD AND IMAGE PROCESSOR THEREFOR
- Publication number 20090304286
- Publication date Dec 10, 2009
- Kyoungmo Yang
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam scanning method and charged particle beam app...
- Publication number 20080073528
- Publication date Mar 27, 2008
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS

Makoto Nishihara

Person

Patents Grantslast 30 patents

Charged particle radiation apparatus

Charged particle beam apparatus for removing charges developed on a...

Charged particle beam apparatus

Charged particle beam scanning method and charged particle beam app...

Template creation method and image processor therefor

Charged particle beam scanning method and charged particle beam app...

Patents Applicationslast 30 patents

Charged Particle Radiation Apparatus

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

IMAGE FORMATION METHOD AND IMAGE FORMATION DEVICE

CHARGED PARTICLE BEAM SCANNING METHOD AND CHARGED PARTICLE BEAM APP...

TEMPLATE CREATION METHOD AND IMAGE PROCESSOR THEREFOR

Charged particle beam scanning method and charged particle beam app...