Makoto Nogami

Person

Tsuchiura, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus
- Patent number 12,078,620
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus column oven
- Patent number 12,050,210
- Issue date Jul 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Makoto Nogami
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis apparatus having a plurality of liquid chromatographs and...
- Patent number 11,982,655
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus provided with a plurality of chromatographic app...
- Patent number 11,959,895
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device
- Patent number 11,385,208
- Issue date Jul 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 10,585,089
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,885,732
- Issue date Feb 6, 2018
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Pretreatment apparatus and mass analyzing apparatus equipped with t...
- Patent number 9,207,152
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing system
- Patent number 9,176,037
- Issue date Nov 3, 2015
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device
- Patent number 9,128,070
- Issue date Sep 8, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Mass analyzing apparatus, analyzing method and calibration sample
- Patent number 8,952,324
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Midori Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pretreatment apparatus and mass spectrometer equipped with the same...
- Patent number 8,926,903
- Issue date Jan 6, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Immunoanalytical method and system using mass spectrometry technology
- Patent number 8,865,418
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Examination device and examination method
- Patent number 8,730,459
- Issue date May 20, 2014
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Sample pretreatment apparatus and mass spectrometer provided with t...
- Patent number 8,604,425
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Sample pretreatment apparatus and mass spectrometer provided with t...
- Patent number 8,319,179
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis Apparatus Column Oven
- Publication number 20240337629
- Publication date Oct 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic Analysis Device
- Publication number 20240319222
- Publication date Sep 26, 2024
- Daisuke EBIHARA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER INCLUDING HPLC AND CONTROL METHOD FOR THE SAME
- Publication number 20240192180
- Publication date Jun 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Midori Tobita
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD FOR AUTOMATIC ANALYZER
- Publication number 20230184802
- Publication date Jun 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
PRETREATMENT METHOD OF AN AUTOMATIC ANALYZER
- Publication number 20220276270
- Publication date Sep 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
Analysis Apparatus Column Oven
- Publication number 20220155266
- Publication date May 19, 2022
- Hitachi High-Tech Corporation
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
Analysis Apparatus
- Publication number 20220107293
- Publication date Apr 7, 2022
- Hitachi High-Tech Corporation
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
Liquid Chromatograph Analyzer and Method of Controlling the Same
- Publication number 20220050088
- Publication date Feb 17, 2022
- Hitachi High-Tech Corporation
- Daisuke AKIEDA
- G01 - MEASURING TESTING
Information Patent Application
Analysis Apparatus Having a Plurality of Chromatographs and Control...
- Publication number 20220011280
- Publication date Jan 13, 2022
- Hitachi High-Tech Corporation
- Izumi OGATA
- G01 - MEASURING TESTING
Information Patent Application
Analysis Apparatus Having a Plurality of Liquid Chromatographs and...
- Publication number 20210389287
- Publication date Dec 16, 2021
- Hitachi High-Tech Corporation
- Daisuke AKIEDA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS PROVIDED WITH A PLURALITY OF CHROMATOGRAPHS
- Publication number 20200371072
- Publication date Nov 26, 2020
- HITACHI HIGH-TECH CORPORATION
- Daisuke AKIEDA
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device
- Publication number 20200340957
- Publication date Oct 29, 2020
- Hitachi High-Technologies Corporation
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20170160273
- Publication date Jun 8, 2017
- Hitachi High-Technologies Corporation
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20160195561
- Publication date Jul 7, 2016
- Hitachi High-Technologies Corporation
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...
- Publication number 20150111300
- Publication date Apr 23, 2015
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER
- Publication number 20150064739
- Publication date Mar 5, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
MASS ANALYZING APPARATUS, ANALYZING METHOD AND CALIBRATION SAMPLE
- Publication number 20130277542
- Publication date Oct 24, 2013
- Midori Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Biological Sample Pretreatment Method and Apparatus
- Publication number 20130130401
- Publication date May 23, 2013
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...
- Publication number 20130075603
- Publication date Mar 28, 2013
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20120322139
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION DEVICE AND EXAMINATION METHOD
- Publication number 20120206713
- Publication date Aug 16, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PROCESSING SYSTEM
- Publication number 20120134895
- Publication date May 31, 2012
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...
- Publication number 20120121464
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
PRETREATMENT APPARATUS AND MASS ANALYZING APPARATUS EQUIPPED WITH T...
- Publication number 20120079875
- Publication date Apr 5, 2012
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER
- Publication number 20120058009
- Publication date Mar 8, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...
- Publication number 20110291004
- Publication date Dec 1, 2011
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
IMMUNOANALYTICAL METHOD AND SYSTEM USING MASS SPECTROMETRY TECHNOLOGY
- Publication number 20110287446
- Publication date Nov 24, 2011
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
PRETREATMENT APPARATUS AND MASS SPECTROMETER EQUIPPED WITH THE SAME...
- Publication number 20110157580
- Publication date Jun 30, 2011
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
Sample preparation method, analysis system and preparation device
- Publication number 20060216795
- Publication date Sep 28, 2006
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Makoto Nogami

Person

Patents Grantslast 30 patents

Analysis apparatus

Analysis apparatus column oven

Analysis apparatus having a plurality of liquid chromatographs and...

Analysis apparatus provided with a plurality of chromatographic app...

Analysis device

Analysis device and analysis method

Analysis device and analysis method

Pretreatment apparatus and mass analyzing apparatus equipped with t...

Specimen processing system

Analysis device

Mass analyzing apparatus, analyzing method and calibration sample

Pretreatment apparatus and mass spectrometer equipped with the same...

Immunoanalytical method and system using mass spectrometry technology

Examination device and examination method

Sample pretreatment apparatus and mass spectrometer provided with t...

Sample pretreatment apparatus and mass spectrometer provided with t...

Patents Applicationslast 30 patents

Analysis Apparatus Column Oven

Automatic Analysis Device

AUTOMATIC ANALYZER INCLUDING HPLC AND CONTROL METHOD FOR THE SAME

CONTROL METHOD FOR AUTOMATIC ANALYZER

PRETREATMENT METHOD OF AN AUTOMATIC ANALYZER

Analysis Apparatus Column Oven

Analysis Apparatus

Liquid Chromatograph Analyzer and Method of Controlling the Same

Analysis Apparatus Having a Plurality of Chromatographs and Control...

Analysis Apparatus Having a Plurality of Liquid Chromatographs and...

ANALYSIS APPARATUS PROVIDED WITH A PLURALITY OF CHROMATOGRAPHS

Analysis Device

ANALYSIS DEVICE AND ANALYSIS METHOD

Analysis Device and Analysis Method

APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...

ANALYZER

MASS ANALYZING APPARATUS, ANALYZING METHOD AND CALIBRATION SAMPLE

Biological Sample Pretreatment Method and Apparatus

SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...

ANALYSIS DEVICE

EXAMINATION DEVICE AND EXAMINATION METHOD

SPECIMEN PROCESSING SYSTEM

APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...

PRETREATMENT APPARATUS AND MASS ANALYZING APPARATUS EQUIPPED WITH T...

ANALYZER

SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...

IMMUNOANALYTICAL METHOD AND SYSTEM USING MASS SPECTROMETRY TECHNOLOGY

PRETREATMENT APPARATUS AND MASS SPECTROMETER EQUIPPED WITH THE SAME...

Sample preparation method, analysis system and preparation device