Makoto Sakurai

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface analyzer of object to be measured and analyzing method
- Patent number 8,541,738
- Issue date Sep 24, 2013
- Japan Science and Technology Agency
- Masahide Tona
- G01 - MEASURING TESTING
Information Patent Grant
Multivalent ion generating source and charged particle beam apparat...
- Patent number 7,544,952
- Issue date Jun 9, 2009
- Japan Science and Technology Agency
- Makoto Sakurai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SURFACE ANALYZER OF OBJECT TO BE MEASURED AND ANALYZING METHOD
- Publication number 20120061564
- Publication date Mar 15, 2012
- Japan Science and Technology Agency
- Masahide Tona
- G01 - MEASURING TESTING
Information Patent Application
Source Of Generating Multicharged Ions And Charged Particle Beam Ap...
- Publication number 20080087842
- Publication date Apr 17, 2008
- Japan Science and Technology Agency
- Makoto Sakurai
- H01 - BASIC ELECTRIC ELEMENTS