Makoto Shinohara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus and analysis method
- Patent number 7,529,994
- Issue date May 5, 2009
- Advantest Corporation
- Makoto Shinohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis apparatus and analysis method
- Publication number 20070240022
- Publication date Oct 11, 2007
- Advantest Corporation
- Makoto Shinohara
- G01 - MEASURING TESTING