Makoto TAYA

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus
- Patent number 9,140,654
- Issue date Sep 22, 2015
- NUFLARE TECHNOLOGY, INC.
- Makoto Taya
- G01 - MEASURING TESTING
Information Patent Grant
Lens periphery edge processing apparatus
- Patent number 6,817,929
- Issue date Nov 16, 2004
- Kabushiki Kaisha Topcon
- Akio Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Lens periphery edge processing apparatus
- Patent number 6,497,614
- Issue date Dec 24, 2002
- Kabushiki Kaisha Topcon
- Akio Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Optical substrate inspection apparatus
- Patent number 6,084,716
- Issue date Jul 4, 2000
- Kabushiki Kaisha Toshiba
- Yasushi Sanada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern evaluation apparatus and a method of pattern evaluation
- Patent number 5,602,645
- Issue date Feb 11, 1997
- Kabushiki Kaisha Toshiba
- Mitsuo Tabata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OBJECTIVE LENS SWITCHING MECHANISM AND INSPECTION APPARATUS
- Publication number 20150138541
- Publication date May 21, 2015
- NuFlare Technology, Inc.
- Hideki NUKADA
- G02 - OPTICS
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140320860
- Publication date Oct 30, 2014
- NUFLARE TECHNOLOGY, INC.
- Makoto TAYA
- G01 - MEASURING TESTING
Information Patent Application
Lens periphery edge processing apparatus
- Publication number 20030060142
- Publication date Mar 27, 2003
- KABUSHIKI KAISHA TOPCON
- Akio Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Lens periphery edge processing apparatus
- Publication number 20010031611
- Publication date Oct 18, 2001
- KABUSHIKI KAISHA TOPCON
- Akio Kobayashi
- B24 - GRINDING POLISHING