Makoto YABE

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 11,688,058
- Issue date Jun 27, 2023
- NuFlare Technology, Inc.
- Makoto Yabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,540,561
- Issue date Jan 21, 2020
- NuFlare Technology, Inc.
- Makoto Yabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method
- Patent number 9,165,355
- Issue date Oct 20, 2015
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20210407061
- Publication date Dec 30, 2021
- NuFlare Technology, Inc.
- Makoto YABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20190095740
- Publication date Mar 28, 2019
- NuFlare Technology, Inc.
- Makoto YABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD
- Publication number 20150279024
- Publication date Oct 1, 2015
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- G06 - COMPUTING CALCULATING COUNTING