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Makoto Yasuda
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Kokubunji, JP
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last 30 patents
Information
Patent Grant
Mass spectrometer using plasma ion source
Patent number
5,148,021
Issue date
Sep 15, 1992
Hitachi, Ltd.
Yukio Okamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave induced plasma source
Patent number
5,086,255
Issue date
Feb 4, 1992
Hitachi, Ltd.
Yukio Okamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Trace element spectrometry with plasma source
Patent number
4,902,099
Issue date
Feb 20, 1990
Hitachi, Ltd.
Yukio Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for controlling electric car
Patent number
4,900,992
Issue date
Feb 13, 1990
Hitachi, Ltd.
Toshihiko Sekizawa
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Apparatus for automatically correcting arc position of high pressur...
Patent number
4,871,947
Issue date
Oct 3, 1989
Hitachi, Ltd.
Tsune Miyashita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-pressure discharge lamp operating circuit
Patent number
4,803,406
Issue date
Feb 7, 1989
Hitachi, Ltd.
Makoto Yasuda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Instrument for spectroscopy having metal halide lamp as light source
Patent number
4,755,056
Issue date
Jul 5, 1988
Hitachi, Ltd.
Makoto Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
High intensity ultraviolet light source
Patent number
4,622,493
Issue date
Nov 11, 1986
Hitachi, Ltd.
Makoto Yasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Discharge lamp with neon gas in outer tube
Patent number
4,622,485
Issue date
Nov 11, 1986
Hitachi, Ltd.
Tsune Miyashita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-pressure discharge lamp operating circuit
Patent number
4,587,460
Issue date
May 6, 1986
Hitachi, Ltd.
Seiichi Murayama
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Liquid chromatography apparatus
Patent number
4,523,096
Issue date
Jun 11, 1985
Hitachi, Ltd.
Makoto Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Temperature control system for an element analyzer
Patent number
4,339,201
Issue date
Jul 13, 1982
Hitachi, Ltd.
Makoto Yasuda
G01 - MEASURING TESTING