Makoto Yonezawa

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Yokohama City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus and analysis method
- Patent number 9,638,729
- Issue date May 2, 2017
- LASERTEC CORPORATION
- Hiroyuki Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image pickup apparatus and defect inspection system for photomask
- Patent number 6,727,987
- Issue date Apr 27, 2004
- Lasertec Corporation
- Makoto Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup apparatus and defect inspection apparatus for photomask
- Patent number 6,654,110
- Issue date Nov 25, 2003
- Lasertec Corporation
- Makoto Yonezawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20140136132
- Publication date May 15, 2014
- Lasertec Corporation
- Hiroyuki MAEKAWA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PICKUP APPARATUS AND DEFECT INSPECTION APPARATUS FOR PHOTOMASK
- Publication number 20030189703
- Publication date Oct 9, 2003
- Lasertec Corporation
- Makoto Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
Image pickup apparatus and defect inspection system for photomask
- Publication number 20020044277
- Publication date Apr 18, 2002
- LASERTEC CORPORATION
- Makoto Yonezawa
- G01 - MEASURING TESTING