Makoto Yoshida

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Nagoya, JP

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Patents Grantslast 30 patents

Information Patent Grant
Reflection type terahertz spectrometer and spectrometric method
- Patent number 7,488,940
- Issue date Feb 10, 2009
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Electric-field distribution measurement method and apparatus for se...
- Patent number 7,466,151
- Issue date Dec 16, 2008
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Optical sampling waveform measuring apparatus
- Patent number 6,980,290
- Issue date Dec 27, 2005
- Yokogawa Electric Corporation
- Hiroshi Ohta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and device for measuring electric field distribution of semi...
- Publication number 20070018634
- Publication date Jan 25, 2007
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Reflection type terahertz spectrometer and spectrometric method
- Publication number 20060231762
- Publication date Oct 19, 2006
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Optical sampling waveform measuring apparatus
- Publication number 20030043366
- Publication date Mar 6, 2003
- Ando Electric Co., Ltd.
- Hiroshi Ohta
- G01 - MEASURING TESTING