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Malik Sadiq
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Walnut Creek, CA, US
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last 30 patents
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Patent Grant
Metrology system calibration refinement
Patent number
10,605,722
Issue date
Mar 31, 2020
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
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Patent Grant
Metrology system calibration refinement
Patent number
9,857,291
Issue date
Jan 2, 2018
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Methods And Systems For Systematic Error Compensation Across A Flee...
Publication number
20240053280
Publication date
Feb 15, 2024
KLA Corporation
Ming Di
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
Publication number
20180100796
Publication date
Apr 12, 2018
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
Publication number
20140340682
Publication date
Nov 20, 2014
Hidong Kwak
G01 - MEASURING TESTING