Mallika Kapur

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systemic diagnostics for increasing wafer yield
- Patent number 8,660,818
- Issue date Feb 25, 2014
- Synopsys, Inc.
- Rohit Kapur
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Systemic Diagnostics For Increasing Wafer Yield
- Publication number 20110040528
- Publication date Feb 17, 2011
- Synopsys, Inc.
- Rohit Kapur
- G06 - COMPUTING CALCULATING COUNTING