Mami Konomi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle device and wiring method
- Patent number 10,808,312
- Issue date Oct 20, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 10,020,163
- Issue date Jul 10, 2018
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle device and wiring method
- Patent number 9,963,776
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion milling device
- Patent number 9,558,912
- Issue date Jan 31, 2017
- Hitachi High-Technologies Corporation
- Asako Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display screen with graphical user interface
- Patent number D774045
- Issue date Dec 13, 2016
- HITACHI HIGH-TECHNOLOGIES CORPROATION
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
- Patent number 9,472,375
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and optical axis adjustment method
- Patent number 9,466,457
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 9,443,694
- Issue date Sep 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device and ion milling processing method
- Patent number 9,355,817
- Issue date May 31, 2016
- Hitachi High-Technologies Corporation
- Shunya Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 9,236,217
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Methods for observing samples and preprocessing thereof
- Patent number 9,086,343
- Issue date Jul 21, 2015
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,058,957
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 8,933,400
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for scanning electron microscope observation of sample float...
- Patent number 8,698,079
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE DEVICE AND WIRING METHOD
- Publication number 20180216223
- Publication date Aug 2, 2018
- Hitachi High-Technologies Corporation
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20160343542
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device
- Publication number 20160126057
- Publication date May 5, 2016
- Hitachi High-Technologies Corporation
- Asako KANEKO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...
- Publication number 20150311033
- Publication date Oct 29, 2015
- HITACHI HIGH-TECHNOLOGY CORPORATION
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE AND WIRING METHOD
- Publication number 20150299842
- Publication date Oct 22, 2015
- Hitachi High-Technologies Corporation
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Observation Apparatus and Optical Axis Adjustment Method
- Publication number 20150228448
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20150083908
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20150076348
- Publication date Mar 19, 2015
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF
- Publication number 20140370540
- Publication date Dec 18, 2014
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...
- Publication number 20140264018
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20140246583
- Publication date Sep 4, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140131590
- Publication date May 15, 2014
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE AND ION MILLING PROCESSING METHOD
- Publication number 20130240353
- Publication date Sep 19, 2013
- Hitachi High-Technologies Corporation
- Shunya Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...
- Publication number 20130221217
- Publication date Aug 29, 2013
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING

Mami Konomi

Person

Patents Grantslast 30 patents

Charged particle device and wiring method

Charged particle beam apparatus, specimen observation system and op...

Charged particle device and wiring method

Ion milling device

Display screen with graphical user interface

Charged particle beam device, sample stage unit, and sample observa...

Observation apparatus and optical axis adjustment method

Charged particle beam apparatus, specimen observation system and op...

Ion milling device and ion milling processing method

Inspection or observation apparatus and sample inspection or observ...

Observation specimen for use in electron microscopy, electron micro...

Methods for observing samples and preprocessing thereof

Charged particle beam apparatus

Inspection or observation apparatus and sample inspection or observ...

Method for scanning electron microscope observation of sample float...

Patents Applicationslast 30 patents

CHARGED PARTICLE DEVICE AND WIRING METHOD

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

Ion Milling Device

Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...

CHARGED PARTICLE DEVICE AND WIRING METHOD

Observation Apparatus and Optical Axis Adjustment Method

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF

OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

CHARGED PARTICLE BEAM APPARATUS

ION MILLING DEVICE AND ION MILLING PROCESSING METHOD

METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOAT...