Membership
Tour
Register
Log in
Mamoru Ishii
Follow
Person
Mie-gun, Mie, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Mass flow control system, and semiconductor manufacturing equipment...
Patent number
11,550,341
Issue date
Jan 10, 2023
Hitachi Metals, Ltd.
Mamoru Ishii
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Flow controller
Patent number
11,442,476
Issue date
Sep 13, 2022
Hitachi Metals Ltd.
Mamoru Ishii
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Thermal mass flow sensor, method for manufacturing the thermal mass...
Patent number
10,859,417
Issue date
Dec 8, 2020
Hitachi Metals, Ltd.
Ryu Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Bypass unit, a base for a flow meter, a base for a flow controller,...
Patent number
10,310,521
Issue date
Jun 4, 2019
Hitachi Metals, Ltd.
Mamoru Ishii
G01 - MEASURING TESTING
Information
Patent Grant
Thermal mass-flow meter and mass-flow control device using same
Patent number
9,970,801
Issue date
May 15, 2018
Hitachi Metals, Ltd.
Mamoru Ishii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MASS FLOW CONTROL SYSTEM, AND SEMICONDUCTOR MANUFACTURING EQUIPMENT...
Publication number
20210405667
Publication date
Dec 30, 2021
Hitachi Metals, Ltd.
Mamoru Ishii
G05 - CONTROLLING REGULATING
Information
Patent Application
FLOW CONTROLLER
Publication number
20210018940
Publication date
Jan 21, 2021
Hitachi Metals, Ltd.
Mamoru Ishii
G05 - CONTROLLING REGULATING
Information
Patent Application
THERMAL MASS FLOW SENSOR, METHOD FOR MANUFACTURING THE THERMAL MASS...
Publication number
20190178693
Publication date
Jun 13, 2019
Hitachi Metals, Ltd.
Ryu Sasaki
G01 - MEASURING TESTING
Information
Patent Application
BYPASS UNIT, A BASE FOR A FLOW METER, A BASE FOR A FLOW CONTROLLER,...
Publication number
20170293308
Publication date
Oct 12, 2017
Hitachi Metals, Ltd.
Mamoru Ishii
G01 - MEASURING TESTING
Information
Patent Application
THERMAL MASS-FLOW METER AND MASS-FLOW CONTROL DEVICE USING SAME
Publication number
20170131127
Publication date
May 11, 2017
Hitachi Metals, Ltd.
Mamoru Ishii
G01 - MEASURING TESTING