Mamoru Kobayashi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,466,181
- Issue date Nov 5, 2019
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, display device, and defect classification...
- Patent number 9,964,500
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 8,422,009
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,986,405
- Issue date Jul 26, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,719,671
- Issue date May 18, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20200057003
- Publication date Feb 20, 2020
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20190094155
- Publication date Mar 28, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device, Display Device, and Defect Classification...
- Publication number 20170328846
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Hisashi HATANO
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20110267605
- Publication date Nov 3, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20100195095
- Publication date Aug 5, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection method and foreign matter inspection appa...
- Publication number 20070201019
- Publication date Aug 30, 2007
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Mamoru Kobayashi

Person

Patents Grantslast 30 patents

Flaw inspection device and flaw inspection method

Defect inspection device, display device, and defect classification...

Foreign matter inspection method and foreign matter inspection appa...

Foreign matter inspection method and foreign matter inspection appa...

Foreign matter inspection method and foreign matter inspection appa...

Patents Applicationslast 30 patents

FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD

FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD

Defect Inspection Device, Display Device, and Defect Classification...

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

Foreign matter inspection method and foreign matter inspection appa...