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Mamoru Tamba

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    I/O module
    • Patent number 10,248,606
    • Issue date Apr 2, 2019
    • Yokogawa Electric Corporation
    • Kazunori Tanimura
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    I/O module
    • Patent number 10,083,143
    • Issue date Sep 25, 2018
    • Yokogawa Electric Corporation
    • Kazunori Tanimura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    I/O module
    • Patent number 9,385,702
    • Issue date Jul 5, 2016
    • Yokogawa Electric Corporation
    • Shunsuke Hayashi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Signal measuring apparatus and semiconductor testing apparatus
    • Patent number 7,719,451
    • Issue date May 18, 2010
    • Yokogawa Electric Corporation
    • Mamoru Tamba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC tester
    • Patent number 7,629,809
    • Issue date Dec 8, 2009
    • Yokogawa Electric Corporation
    • Mamoru Tamba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Single end to differential signal converter
    • Patent number 7,327,301
    • Issue date Feb 5, 2008
    • Agilent Technologies, Inc.
    • Mamoru Tamba
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Calibration method for interleaving an A/D converter
    • Patent number 7,161,514
    • Issue date Jan 9, 2007
    • Agilent Technologies, Inc.
    • Mamoru Tamba
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

  • Information Patent Application

    I/O MODULE
    • Publication number 20180341609
    • Publication date Nov 29, 2018
    • YOKOGAWA ELECTRIC CORPORATION
    • Kazunori Tanimura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    I/O MODULE
    • Publication number 20160134269
    • Publication date May 12, 2016
    • YOKOGAWA ELECTRIC CORPORATION
    • Shunsuke HAYASHI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    I/O MODULE
    • Publication number 20150120972
    • Publication date Apr 30, 2015
    • YOKOGAWA ELECTRIC CORPORATION
    • Kazunori Tanimura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    IC TESTER
    • Publication number 20090134891
    • Publication date May 28, 2009
    • YOKOGAWA ELECTRIC CORPORATION
    • Mamoru TAMBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Signal measuring apparatus and semiconductor testing apparatus
    • Publication number 20080109179
    • Publication date May 8, 2008
    • YOKOGAWA ELECTRIC CORPORATION
    • Mamoru TAMBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Single end to differential signal converter
    • Publication number 20040201510
    • Publication date Oct 14, 2004
    • AGILENT TECHNOLOGIES, INC.
    • Mamoru Tamba
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    CALIBRATIPN METHOD FOR INTERLEAVING AN A/D CONVERTER
    • Publication number 20030080885
    • Publication date May 1, 2003
    • AGILENT TECHNOLOGIES, INC.
    • Mamoru Tamba
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Method of interleaving with redundancy, and A/D converter, D/A conv...
    • Publication number 20010052864
    • Publication date Dec 20, 2001
    • Atsushi Shimizu
    • H03 - BASIC ELECTRONIC CIRCUITRY