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Tokyo, JP
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last 30 patents
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Patent Application
TEMPERATURE CALIBRATION METHOD
Publication number
20240201030
Publication date
Jun 20, 2024
SEMITEC CORPORATION
Shigenao MARUYAMA
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE, THERMOMETER, TEMPERATURE MEASUREMEN...
Publication number
20240068884
Publication date
Feb 29, 2024
SEMITEC CORPORATION
Shigenao MARUYAMA
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...
Publication number
20230296447
Publication date
Sep 21, 2023
SEMITEC CORPORATION
Shigenao MARUYAMA
G01 - MEASURING TESTING
Information
Patent Application
CONTACT FORCE SENSOR AND DEVICE PROVIDED WITH CONTACT FORCE SENSOR
Publication number
20220291059
Publication date
Sep 15, 2022
SEMITEC CORPORATION
Yutaro TABATA
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR
Publication number
20220276110
Publication date
Sep 1, 2022
SEMITEC CORPORATION
Tadashi MATSUDATE
G01 - MEASURING TESTING
Information
Patent Application
Stock Portfolio Selection Device, Stock Portfolio Selection Method...
Publication number
20080249957
Publication date
Oct 9, 2008
Hiroaki Masuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Enterprise Evaluation Supporting Device
Publication number
20080177592
Publication date
Jul 24, 2008
Hiroaki Masuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Stock portfolio selection device, stock portfolio selection method...
Publication number
20060200395
Publication date
Sep 7, 2006
Hiroaki Masuyama
G06 - COMPUTING CALCULATING COUNTING